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ADIS16362BMLZ 参数 Datasheet PDF下载

ADIS16362BMLZ图片预览
型号: ADIS16362BMLZ
PDF下载: 下载PDF文件 查看货源
内容描述: 六自由度惯性传感器 [Six Degrees of Freedom Inertial Sensor]
分类和应用: 传感器
文件页数/大小: 20 页 / 513 K
品牌: ADI [ ADI ]
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ADIS16362  
Status  
DIAGNOSTICS  
The error flags provide indicator functions for common  
system level issues. All of the flags are cleared (set to 0) after  
each DIAG_STAT register read cycle. If an error condition  
remains, the error flag returns to 1 during the next sample  
cycle. The DIAG_STAT[1:0] bits do not require a read of this  
register to return to 0. If the power supply voltage goes back  
into range, these two flags are cleared automatically.  
Self-Test  
The self-test function allows the user to verify the mechanical  
integrity of each MEMS sensor. It applies an electrostatic force to  
each sensor element, which results in mechanical displacement  
that simulates a response to actual motion. Table 1 lists the  
expected response for each sensor, which provides pass/fail  
criteria. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the  
internal self-test routine, which exercises all inertial sensors,  
measures each response, makes pass/fail decisions, and reports  
them to error flags in the DIAG_STAT register. MSC_CTRL[10]  
resets itself to 0 after completing the routine. The MSC_CTRL[9:8]  
bits provide manual control over the self-test function for inves-  
tigation of potential failures. Table 25 outlines an example test  
flow for using this option to verify the x-axis gyroscope function.  
Table 26. DIAG_STAT Bit Descriptions  
Bit  
[±ꢀ]  
[±4]  
[±3]  
[±2]  
[±±]  
[±0]  
[9]  
Description  
Z-axis accelerometer self-test failure (± = fail, 0 = pass)  
Y-axis accelerometer self-test failure (± = fail, 0 = pass)  
X-axis accelerometer self-test failure (± = fail, 0 = pass)  
Z-axis gyroscope self-test failure (± = fail, 0 = pass)  
Y-axis gyroscope self-test failure (± = fail, 0 = pass)  
X-axis gyroscope self-test failure (± = fail, 0 = pass)  
Alarm 2 status (± = active, 0 = inactive)  
Alarm ± status (± = active, 0 = inactive)  
Not used  
Table 25. Manual Self-Test Example Sequence  
DIN  
Description  
[8]  
[ꢁ]  
0xBꢃ0±  
0xB904  
0xB802  
SMPL_PRD[ꢁ:0] = 0x0±, sample rate = 8±9.2 SPS  
SENS_AVG[±ꢀ:8] = 0x04, gyro range = ±300°/sec  
SENS_AVG[ꢁ:0] = 0x02, four-tap averaging filter  
Delay = ꢀ0 ms  
Read XGYRO_OUT  
MSC_CTRL[9] = ±, gyroscope negative self-test  
Delay = ꢀ0 ms  
[ꢃ]  
[ꢀ]  
[4]  
Flash test, checksum flag (± = fail, 0 = pass)  
Self-test diagnostic error flag (± = fail, 0 = pass)  
Sensor overrange (± = fail, 0 = pass)  
0x0400  
0xBꢀ02  
[3]  
[2]  
SPI communication failure (± = fail, 0 = pass)  
Flash update failure (± = fail, 0 = pass)  
[±]  
Power supply above ꢀ.2ꢀ V  
0x0400  
Read XGYRO_OUT  
(± = power supply ≥ ꢀ.2ꢀ V, 0 = power supply ≤ ꢀ.2ꢀ V)  
Determine whether the bias in the gyroscope  
output changes according to the expectation set  
in Table ±  
[0]  
Power supply below 4.ꢁꢀ V  
(± = power supply ≤ 4.ꢁꢀ V, 0 = power supply ≥ 4.ꢁꢀ V)  
0xBꢀ0±  
0x0400  
MSC_CTRL[9:8] = 0±, gyroscope/accelerometer  
positive self-test  
Delay = ꢀ0 ms  
Alarm Registers  
The alarm function provides monitoring for two independent  
conditions. The ALM_CTRL register provides control inputs  
for data source, data filtering (prior to comparison), static  
comparison, dynamic rate-of-change comparison, and output  
indicator configurations. The ALM_MAGx registers establish  
the trigger threshold and polarity configurations. Table 30 gives  
an example of how to configure a static alarm. The ALM_SMPLx  
registers provide the numbers of samples to use in the dynamic  
rate-of-change configuration. The period equals the number in  
the ALM_SMPLx register multiplied by the sample period time,  
which is established by the SMPL_PRD register. See Table 31 for  
an example of how to configure the sensor for this type of function.  
Read XGYRO_OUT  
Determine whether the bias in the gyroscope  
changed according to the self-test response in  
Table ±  
0xBꢀ00  
MSC_CTRL[±ꢀ:8] = 0x00  
Zero motion provides results that are more reliable. The set-  
tings in Table 25 are flexible and allow for optimization around  
speed and noise influence. For example, using fewer filtering  
taps decreases delay times but increases the possibility of noise  
influence.  
Memory Test  
Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a  
checksum verification of the flash memory locations. The  
pass/fail result is loaded into DIAG_STAT[6].  
Rev. 0 | Page ±ꢀ of 20  
 
 
 
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