ADG711/ADG712/ADG713
TEST CIRCUITS
I
DS
V1
S
V
S
D
I
D
(ON)
A
V
D
S
V
S
D
00042-013
Figure 13. On Leakage
R
ON
= V1/I
DS
Figure 11. On Resistance
I
S
(OFF)
A
S
D
I
D
(OFF)
A
V
S
V
D
Figure 12. Off Leakage
V
DD
V
IN
V
DD
S
V
S
IN
GND
D
R
L
300Ω
C
L
35pF
V
OUT
V
S
V
OUT
90%
90%
00042-016
0.1µF
00042-014
ADG711
50%
50%
V
IN
ADG712
50%
50%
t
ON
t
OFF
Figure 14. Switching Times
0.1µF
V
DD
V
IN
0V
50%
50%
V
DD
V
S1
V
S2
IN1, IN2
S1
S2
D1
D2
R
L2
300Ω
C
L2
35pF
V
OUT2
R
L1
300Ω
C
L1
35pF
V
OUT2
90%
0V
V
OUT1
V
OUT1
0V
90%
90%
90%
GND
t
D
t
D
Figure 15. Break-Before-Make Time Delay, t
D
V
DD
V
IN
D
C
L
15nF
GND
Q
INJ
= C
L
× V
OUT
V
OUT
V
OUT
∆V
OUT
00042-018
SW ON
SW OFF
V
DD
R
S
V
S
IN
S
Figure 16. Charge Injection
00042-017
ADG713
00042-015