ADG511/ADG512/ADG513
Single Supply
(V
Parameter
ANALOG SWITCH
Analog Signal Range
R
ON
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF)
Drain OFF Leakage I
D
(OFF)
Channel ON Leakage I
D
, I
S
(ON)
DIGITAL INPUTS
Input High Voltage, V
INH
Input Low Voltage, V
INL
Input Current
I
INL
or I
INH
DYNAMIC CHARACTERISTICS
2
t
ON
t
OFF
Break-Before-Make Time
Delay, t
D
(ADG513 Only)
Charge Injection
OFF Isolation
Channel-to-Channel Crosstalk
C
S
(OFF)
C
D
(OFF)
C
D
, C
S
(ON)
POWER REQUIREMENTS
V
DD
I
DD
DD
= +5 V
10%, V
SS
= 0 V, GND = 0 V, unless otherwise noted)
B Versions
–40 C to
+25 C
+85 C
0 V to V
DD
45
75
±
0.025
±
0.1
±
0.025
±
0.1
±
0.05
±
0.2
±
0.025
±
0.1
±
0.025
±
0.1
±
0.05
±
0.2
45
75
T Versions
–55 C to
+25 C
+125 C
0 V to V
DD
Units
V
Ω
typ
Ω
max
nA typ
nA max
nA typ
nA max
nA typ
nA max
V min
V max
µA
typ
µA
max
ns typ
ns max
ns typ
ns max
ns typ
pC typ
dB typ
dB typ
pF typ
pF typ
pF typ
Test Conditions/Comments
V
D
= +3.5 V, I
S
= –10 mA;
V
DD
= +4.5 V
V
DD
= +5.5 V
V
D
= 4.5/1 V, V
S
= 1 4.5 V;
Test Circuit 2
V
D
= 4.5/1 V, V
S
= 1 4.5 V;
Test Circuit 2
V
D
= V
S
= +4.5 V/+1 V;
Test Circuit 3
±
2.5
±
2.5
±
5
2.4
0.8
±
2.5
±
2.5
±
5
2.4
0.8
0.005
±
0.1
0.005
±
0.1
V
IN
= V
INL
or V
INH
250
500
50
100
200
16
68
85
9
9
35
+4.5/5.5
0.0001
1
250
500
50
100
200
16
68
85
9
9
35
+4.5/5.5
0.0001
1
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +2 V; Test Circuit 4
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +2 V; Test Circuit 4
R
L
= 300
Ω,
C
L
= 35 pF;
V
S1
= V
S2
= +2 V; Test Circuit 5
V
S
= 0 V, R
S
= 0
Ω,
C
L
= 10 nF;
Test Circuit 6
R
L
= 50
Ω,
C
L
= 5 pF, f = 1 MHz;
Test Circuit 7
R
L
= 50
Ω,
C
L
= 5 pF, f = 1 MHz;
Test Circuit 8
f = 1 MHz
f = 1 MHz
f = 1 MHz
V min/max
µA
typ
µA
max
V
DD
= +5.5 V
Digital Inputs = 0 V or 5 V
NOTES
1
Temperature ranges are as follows: B Versions –40°C to +85°C; T Versions –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. B
–3–
AD [ ANALOG DEVICES ]
