ADG406/ADG407/ADG426–SPECIFICATIONS
DUAL SUPPLY
Parameter
ANALOG SWITCH
Analog Signal Range
R
ON
R
ON
Match
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF)
Drain OFF Leakage I
D
(OFF)
ADG406, ADG426
ADG407
Channel ON Leakage I
D
, I
S
(ON)
ADG406, ADG426
ADG407
DIGITAL INPUTS
Input High Voltage, V
INH
Input Low Voltage, V
INL
Input Current
I
INL
or I
INH
C
IN
, Digital Input Capacitance
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
B Version
–40°C to
+25°C
+85°C
V
SS
to V
DD
50
80
4
±
0.5
±
1
±
1
±
1
±
1
125
50
80
4
±
0.5
±
1
±
1
±
1
±
1
T Version
–55°C to
+25°C
+125°C
V
SS
to V
DD
125
1
(V
DD
= +15 V
±
10%, V
SS
= –15 V
±
10%, GND = 0 V, unless otherwise noted)
Units
V
Ω
typ
Ω
max
Ω
typ
nA max
nA max
nA max
nA max
nA max
V min
V max
µA
max
pF typ
ns typ
ns max
ns min
ns typ
ns max
ns typ
ns max
ns min
ns min
ns min
ns min
pC typ
dB typ
dB typ
pF typ
pF typ
pF typ
Test Conditions/Comments
V
D
=
±
10 V, I
S
= –1 mA
V
DD
= +13.5 V, V
SS
= –13.5 V
V
D
= 0 V, I
S
= –1 mA
V
DD
= +16.5 V, V
SS
= –16.5 V
V
D
=
±
10 V, V
S
= 10 V, Test Circuit 2
V
D
=
±
10 V, V
S
= 10 V;
Test Circuit 3
V
S
= V
D
=
±
10 V;
Test Circuit 4
±
20
±
20
±
20
±
20
±
20
2.4
0.8
±
1
±
50
±
200
±
100
±
200
±
100
2.4
0.8
±
1
8
120
150
10
120
160
110
150
8
120
150
10
120
160
110
150
V
IN
= 0 or V
DD
f = 1 MHz
R
L
= 300
Ω,
C
L
= 35 pF;
V
1
=
±
10 V, V
2
= 10 V;
Test Circuit 5
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +5 V, Test Circuit 6
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +5 V, Test Circuit 7
R
L
= 300
Ω,
C
L
= 35 pF;
V
S
= +5 V, Test Circuit 7
250
10
175
225
130
180
100
100
10
100
250
10
175
225
130
180
100
100
10
100
Break Before Make Delay, t
OPEN
t
ON
(EN,
WR)
t
OFF
(EN,
RS)
ADG426 Only
t
W
, Write Pulse Width
t
S
, Address, Enable Setup Time
t
H
, Address, Enable Hold Time
t
RS
, Reset Pulse Width
Charge Injection
OFF Isolation
Channel-to-Channel Crosstalk
C
S
(OFF)
C
D
(OFF)
ADG406, ADG426
ADG407
C
D
, C
S
(ON)
ADG406, ADG426
ADG407
POWER REQUIREMENTS
I
DD
I
SS
I
DD
I
SS
N
OTES
1
2
8
–75
85
5
50
25
60
40
1
5
1
5
100
200
500
1
5
8
–75
85
5
50
25
60
40
1
5
1
5
100
200
500
1
5
V
S
= +5 V
V
S
= 0 V, R
S
= 0
Ω,
C
L
= 1 nF;
Test Circuit 10
R
L
= 1 kΩ, f = 100 kHz;
V
EN
= 0 V, Test Circuit 11
R
L
= 1 kΩ, f = 100 kHz, Test Circuit 12
f = 1 MHz
f = 1 MHz
f = 1 MHz
pF typ
pF typ
µA
typ
µA
max
µA
typ
µA
max
µA
typ
µA
max
µA
typ
µA
max
V
DD
= +16.5 V, V
SS
= –16.5 V
V
IN
= 0 V, V
EN
= 0 V
V
IN
= 0 V, V
EN
= 2.4 V
Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. 0
AD [ ANALOG DEVICES ]
