欢迎访问ic37.com |
会员登录 免费注册
发布采购

ADA4637-1ACPZ-RL 参数 Datasheet PDF下载

ADA4637-1ACPZ-RL图片预览
型号: ADA4637-1ACPZ-RL
PDF下载: 下载PDF文件 查看货源
内容描述: 30 V ,高速,低噪声,低偏置电流 [30 V, High Speed, Low Noise, Low Bias Current]
分类和应用:
文件页数/大小: 20 页 / 761 K
品牌: ADI [ ADI ]
 浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第1页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第2页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第3页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第4页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第6页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第7页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第8页浏览型号ADA4637-1ACPZ-RL的Datasheet PDF文件第9页  
Data Sheet  
ADA4627-1/ADA4637-1  
ABSOLUTE MAXIMUM RATINGS  
Table 3.  
THERMAL RESISTANCE  
θJA is specified for the worst-case conditions, that is, a device  
soldered in a circuit board for surface-mount packages. This  
was measured using a standard 2-layer board. For the LFCSP  
package, the exposed pad should be soldered to a copper plane.  
Parameter  
Rating  
Supply Voltage  
Input Voltage Range1  
Input Current1  
Differential Input Voltage2  
Output Short-Circuit Duration to GND Indefinite  
Storage Temperature Range  
Operating Temperature Range  
Junction Temperature Range  
36 V  
(V−) − 0.3 V to (V+) + 0.3 V  
10 mA  
VSY  
Table 4. Thermal Resistance  
Package Type  
θJA  
155  
77  
θJC  
45  
14  
Unit  
°C/W  
°C/W  
−65°C to +150°C  
−40°C to +125°C  
−65°C to +150°C  
8-Lead SOIC_N (R-8)  
8-Lead LFCSP (CP-8-2)  
Lead Temperature (Soldering, 60 sec) 300°C  
ESD Human Body Model 4 kV  
ESD CAUTION  
1 Input pin has clamp diodes to the power supply pins. Input current should  
be limited to 10 mA or less whenever input signals exceed the power supply  
rail by 0.3 V.  
2 Differential input voltage is limited to 30 V or the supply voltage, whichever  
is less.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Rev. E | Page 5 of 20  
 
 
 
 
 
 
 复制成功!