AD7524
ABSOLUTE MAXIMUM RATINGS*
(T
A
= +25°C, unless otherwise noted)
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V
V
RFB
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±
25 V
V
REF
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±
25 V
Digital Input Voltage to GND . . . . . . . . –0.3 V to V
DD
+0.3 V
OUT1, OUT2 to GND . . . . . . . . . . . . . –0.3 V to V
DD
+0.3 V
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Power Dissipation (Any Package)
To +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 450 mW
Derates above 75°C by . . . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature
Commercial (J, K, L) . . . . . . . . . . . . . . . . . –40°C to +85°C
Industrial (A, B, C) . . . . . . . . . . . . . . . . . . –40°C to +85°C
Extended (S, T, U) . . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300°C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7524 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
TERMINOLOGY
RELATIVE ACCURACY:
A measure of the deviation from a
straight line through the end points of the DAC transfer function.
Normally expressed as a percentage of full scale range. For the
AD7524 DAC, this holds true over the entire V
REF
range.
with all 1s in the DAC after offset error has been adjusted out
and is expressed in LSBs. Gain Error is adjustable to zero with
an external potentiometer.
FEEDTHROUGH ERROR:
Error caused by capacitive cou-
pling from V
REF
to output with all switches OFF.
RESOLUTION:
Value of the LSB. For example, a unipolar con-
OUTPUT CAPACITANCE:
Capacity from OUT1 and
verter with n bits has a resolution of (2
–n
) (V
REF
). A bipolar con-
OUT2 terminals to ground.
verter of n bits has a resolution of [2
–(n–1)
] [V
REF
]. Resolution in no
OUTPUT LEAKAGE CURRENT:
Current which appears
way implies linearity.
on OUT1 terminal with all digital inputs LOW or on OUT2
GAIN ERROR:
Gain Error is a measure of the output error be-
terminal when all inputs are HIGH. This is an error current
tween an ideal DAC and the actual device output. It is measured
which contributes an offset voltage at the amplifier output.
PIN CONFIGURATIONS
DIP, SOIC
PLCC
LCCC
REV. B
–3–
AD [ ANALOG DEVICES ]
