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5962R8954203VPA 参数 Datasheet PDF下载

5962R8954203VPA图片预览
型号: 5962R8954203VPA
PDF下载: 下载PDF文件 查看货源
内容描述: [Aerospace Precision JFET-Input Op Amp]
分类和应用: 放大器
文件页数/大小: 12 页 / 116 K
品牌: ADI [ ADI ]
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TABLE IIA. Electrical test requirements.  
Subgroups  
Test requirements  
Subgroups  
(in accordance with  
(in accordance with  
MIL-STD-883,  
MIL-PRF-38535, table III)  
method 5005, table I)  
Device  
Device  
class Q  
Device  
class V  
class M  
1
Interim electrical  
1
1
parameters (see 4.2)  
Final electrical  
1, 2, 3, 4, 5, 1/  
6, 7, 8A  
1, 2, 3, 4, 1/  
5, 6, 7, 8A  
1, 2, 3, 1/ 2/  
4, 5, 6, 7, 8A  
1, 2, 3, 4, 3/  
parameters (see 4.2)  
1, 2, 3, 4, 5, 6, 3/  
7, 8A, 9, 10  
1, 2, 3, 4, 3/  
Group A test  
5, 6, 7, 8A, 9,  
10  
5, 6, 7, 8A,  
9, 10  
requirements (see 4.4)  
Group C end-point electrical  
parameters (see 4.4)  
1,4  
1,4  
---  
1,4  
1,4  
---  
1,4 2/  
Group D end-point electrical  
parameters (see 4.4)  
1,4  
Group E end-point electrical  
parameters (see 4.4)  
---  
1/ PDA applies to subgroup 1. Exclude delta from PDA. (V  
for device 01 and 03)  
and I  
excluded from PDA  
OS  
OS  
2/ See table IIB for delta measurement parameters.  
3/ Subgroup 10, if not tested, shall be guaranteed to the limits specified in table I herein.  
Table IIB. 240 hour burn-in and group C end-point electrical parameters.  
Parameter  
Device type  
03  
Limit  
Delta  
0.5 mV  
±0.5 mV  
V
OS  
IB  
±50 pA  
±40 pA  
I
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in  
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups  
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).  
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with  
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device  
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for  
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections  
(see 4.4.1 through 4.4.4).  
4.4.1 Group A inspection.  
a. Tests shall be as specified in table IIA herein.  
b. Subgroup 11 in table I, method 5005 of MIL-STD-883 shall be omitted.  
SIZE  
STANDARD  
5962-89542  
A
MICROCIRCUIT DRAWING  
DLA LAND AND MARITIME  
REVISION LEVEL  
E
SHEET  
COLUMBUS, OHIO 43218-3990  
9
DSCC FORM 2234  
APR 97