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5962-8512702VZA 参数 Datasheet PDF下载

5962-8512702VZA图片预览
型号: 5962-8512702VZA
PDF下载: 下载PDF文件 查看货源
内容描述: [IC 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CDFP28, LEAD FREE, DFP-28, Analog to Digital Converter]
分类和应用: 转换器
文件页数/大小: 22 页 / 151 K
品牌: ADI [ ADI ]
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TABLE IIA. Electrical test requirements.  
Subgroups  
(in accordance with  
MIL-STD-883,  
Subgroups  
Test requirements  
(in accordance with  
MIL-PRF-38535, table III)  
method 5005, table I)  
Device  
Device  
class Q  
Device  
class V  
class M  
Interim electrical  
1
1
1
parameters (see 4.2)  
1/  
1/  
1/, 2/  
1, 2, 3, 4, 12  
1, 2, 3, 4, 7, 9,  
10, 11, 12  
2/  
Final electrical  
1, 2, 3, 4, 12  
1, 2, 3, 4, 7, 9,  
10, 11, 12  
1, 2, 3, 4, 12  
1, 2, 3, 4, 7, 9,  
10, 11, 12  
parameters (see 4.2)  
Group A test  
requirements (see 4.4)  
Group C end-point electrical  
parameters (see 4.4)  
1, 4  
1, 4  
1, 4  
1, 4  
1, 4  
Group D end-point electrical  
parameters (see 4.4)  
1, 4  
1
Group E end-point electrical  
parameters (see 4.4)  
- - -  
- - -  
1/ PDA applies to subgroup 1.  
2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be computed  
with reference to the previous interim electrical parameters.  
TABLE IIB. 240 hour burn-in and group C end-point electrical parameters.  
Endpoint limits  
Test title  
Delta limits  
Units  
Min  
-1  
Max  
2
Uni Vio  
Bpze  
Ae  
+0.5  
+1  
LSB  
LSB  
-5.5  
4.5  
-0.35  
0.35  
+.10  
%FSR  
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with  
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device class  
M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M  
shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through  
4.4.4).  
4.4.1 Group A inspection.  
a. Tests shall be as specified in table IIA herein.  
b. For device class M, subgroups 7 tests shall be sufficient to verify the truth table. For device classes Q and V, subgroups 7  
shall include verifying the functionality of the device.  
c. Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.  
d. Optional subgroup 12, for device type 01, is used for grading the part selection at 25°C.  
SIZE  
STANDARD  
MICROCIRCUIT DRAWING  
5962-85127  
A
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
H
SHEET  
18  
DSCC FORM 2234  
APR 97  
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