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5962-8965703LX 参数 Datasheet PDF下载

5962-8965703LX图片预览
型号: 5962-8965703LX
PDF下载: 下载PDF文件 查看货源
内容描述: [Dual 12-Bit CMOS DAC with Parallel Load Input Structure]
分类和应用: 转换器
文件页数/大小: 12 页 / 101 K
品牌: ADI [ ADI ]
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3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN  
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD  
PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.  
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance  
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in  
accordance with MIL-PRF-38535 to identify when the QML flow option is used.  
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an  
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and  
Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the  
requirements of MIL-PRF-38535, appendix A and the requirements herein.  
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided  
with each lot of microcircuits delivered to this drawing.  
3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that  
affects this drawing.  
3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime's agent, and the acquiring activity retain the  
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made  
available onshore at the option of the reviewer.  
4. VERIFICATION  
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,  
appendix A.  
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices  
prior to quality conformance inspection. The following additional criteria shall apply:  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level  
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify  
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method  
1015 of MIL-STD-883.  
(2) TA = +125°C, minimum.  
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter  
tests prior to burn-in are optional at the discretion of the manufacturer.  
c. Subgroup 12 test is used for grading and part selection at +25°C and is not included in PDA calculations.  
SIZE  
STANDARD  
5962-89657  
A
MICROCIRCUIT DRAWING  
DLA LAND AND MARITIME  
REVISION LEVEL  
C
SHEET  
COLUMBUS, OHIO 43218-3990  
9
DSCC FORM 2234  
APR 97