欢迎访问ic37.com |
会员登录 免费注册
发布采购

5962-8863001VX 参数 Datasheet PDF下载

5962-8863001VX图片预览
型号: 5962-8863001VX
PDF下载: 下载PDF文件 查看货源
内容描述: [IC INSTRUMENTATION AMPLIFIER, 80 uV OFFSET-MAX, 0.57 MHz BAND WIDTH, CDIP18, CERDIP-18, Instrumentation Amplifier]
分类和应用: 放大器
文件页数/大小: 22 页 / 244 K
品牌: ADI [ ADI ]
 浏览型号5962-8863001VX的Datasheet PDF文件第2页浏览型号5962-8863001VX的Datasheet PDF文件第3页浏览型号5962-8863001VX的Datasheet PDF文件第4页浏览型号5962-8863001VX的Datasheet PDF文件第5页浏览型号5962-8863001VX的Datasheet PDF文件第7页浏览型号5962-8863001VX的Datasheet PDF文件第8页浏览型号5962-8863001VX的Datasheet PDF文件第9页浏览型号5962-8863001VX的Datasheet PDF文件第10页  
AMP01  
WAFER TEST LIMITS (@ VS = ؎15 V, RS = 10 k, RL = 2 k, TA = +25؇C, unless otherwise noted)  
AMP01NBC  
AMP01GBC  
Limit  
Parameter  
Symbol Conditions  
Limit  
Units  
Input Offset Voltage  
Output Offset Voltage  
Offset Referred to Input  
vs. Positive Supply  
VIOS  
VOOS  
PSR  
60  
4
120  
8
µV max  
mV max  
dB min  
dB min  
dB min  
dB min  
dB min  
dB min  
dB min  
dB min  
dB min  
dB min  
nA max  
nA max  
V min  
V+ = +5 V to +15 V  
G = 1000  
G = 100  
G = 10  
120  
110  
95  
110  
100  
90  
G = 1  
75  
70  
Offset Referred to Input  
vs. Negative Supply  
PSR  
V– = –5 V to –15 V  
G = 1000  
G = 100  
G = 10  
105  
90  
70  
50  
4
1
±10  
105  
90  
70  
50  
8
3
±10  
G = 1  
Input Bias Current  
IB  
IOS  
IVR  
CMR  
Input Offset Current  
Input Voltage Range  
Common Mode Rejection  
Guaranteed by CMR Tests  
VCM = ±10 V  
G = 1000  
G = 100  
G = 10  
dB min  
dB min  
dB min  
dB min  
dB min  
125  
120  
100  
85  
115  
110  
95  
G = 1  
75  
20 × RS  
RG  
Gain Equation Accuracy  
Output Voltage Swing  
G =  
0.6  
0.8  
% max  
VOUT  
VOUT  
VOUT  
RL = 2 kΩ  
RL = 500 Ω  
RL = 50 Ω  
Output to Ground Short  
Output to Ground Short  
+V Linked to +VOP  
–V Linked to –VOP  
±13  
±13  
±2.5  
±60  
±120  
4.8  
±13  
±13  
±2.5  
±60  
±120  
4.8  
V min  
V min  
V min  
mA min  
mA max  
mA max  
mA max  
Output Current Limit  
Output Current Limit  
Quiescent Current  
IQ  
4.8  
4.8  
NOTE  
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed  
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.  
V+  
V
IOS  
+V  
NULL  
OP  
A1  
OUTPUT  
250⍀  
250⍀  
–V  
OP  
–IN  
+IN  
Q1  
Q2  
REFERENCE  
R1  
47.5k⍀  
R3  
47.5k⍀  
R
GAIN  
SENSE  
A2  
A3  
R
SCALE  
R2  
2.5k⍀  
R4  
2.5k⍀  
V
NULL  
OOS  
V–  
Figure 1. Simplified Schematic  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AMP01 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. D  
–6–