TABLE IIA. Electrical test requirements.
Subgroups
Test requirements
Subgroups
(in accordance with
(in accordance with
MIL-STD-883,
MIL-PRF-38535, table III)
method 5005, table I)
Device
class M
1
Device
class Q
Device
class V
Interim electrical
1
1
parameters (see 4.2)
Final electrical
1,2,3,4,7
1/
1,2,3,4,7
1/
1,2,3, 1/ 2/
parameters (see 4.2)
Group A test
4,7
1,2,3,4,5,6,
1,2,3,4,5,6,
1,2,3,4,5,6,
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
7,8
1
7,8
1
7,8
1,2,3,4,5, 2/
6,7,8
1
1
1
1,2,3,4,7
1,2,3,4,7
1,2,3,4,7
1/ PDA applies to subgroup 1.
2/ Delta limits in accordance with table IIB shall be computed with reference to the previous interim electrical
parameters.
TABLE IIB. 240 hour burn-in and group C end-point electrical parameters.
Test
Limit
Delta
Max
+75
2
Min
-150
-3
Max
150
3
Min
-75
-2
Unit
µV
nA
VIO
+IIB
-IIB
-3
3
-2
2
nA
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1005 of MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
SIZE
STANDARD
5962-87771
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
9
DSCC FORM 2234
APR 97
ADI [ ADI ]
