HiRel FPGAs
TDI
Test Data In
Serial data input for JTAG instructions and data. Data is
shifted in on the rising edge of TCLK. This pin functions as an
I/O when the JTAG fuse is not programmed. JTAG pins are
only available in the 3200DX device.
TDO
Test Data Out
Serial data output for JTAG instructions and test data. This pin
functions as an I/O when the JTAG fuse is not programmed.
JTAG pins are only available in the 3200DX device.
TMS
Test Mode Select
Serial data input for JTAG test mode. Data is shifted in on the
rising edge of TCLK. This pin functions as an I/O when the
JTAG fuse is not programmed. JTAG pins are only available in
the 3200DX device.
57
ACTEL [ Actel Corporation ]
