MIL-PRF-38535K
3.4.3 Qualification to RHA levels. Qualification to a RHA level shall consist of characterization to the highest offered RHA
level of total ionizing dose (TID). The conditions for radiation testing shall consist of exposing the devices in a step-stress
manner to the highest dose level offered and as a minimum the two next consecutive lower RHA levels. The levels are
identified as follows: 3K Rad(Si), 10K Rad(Si), 30K Rad(Si), 50K Rad(Si), 100 K Rad(Si), 300K Rad(Si), 500K Rad(Si), 1M
Rad(Si). The radiation testing plan (QM Plan) and qualification to the appropriate quality and reliability assurance level for
device classes B, Q, S, V, Y or T shall be submitted for QA approval. The designator RHA levels are defined below:
RHA levels:
RHA level designator
Total ionizing dose (TID) level in Rad (Si)
(see 3.6.2.1)
/ or -
M
D
No RHA
3x103
10x103
30x103
50x103
100x103
300x103
500x103
106
P
L
R
F
G
H
3.4.4 QML listing. A certificate of qualification shall be issued upon successful completion of all qualification tests on the
two demonstration vehicles and the acceptance of the qualification documentation by the QA. Issuance of the certificate of
qualification shall coincide with listing of the manufacturing line and the SMD(s), or existing MIL-M-38510 device
specification(s) on the QML. The manufacturer may be removed from the QML by the QA for cause.
3.4.5 Maintenance and retention of QML. In order to sustain qualification status after initial qualification, the manufacturer
shall fabricate and perform qualification testing on the selected SEC and TCV, or approved alternate assessment procedure
as defined in the QM plan.
3.4.6 QML line shutdown. If an extended shutdown of a QML certified/qualified flow is necessary, the TRB shall assess and
ensure that the process is still capable when production is restarted and notify the QA.
3.4.7 Revalidation reviews. The interval between on-site revalidation reviews shall normally not exceed two years, but the
QA shall adjust this interval based on the manufacturer's TRB reports, customer feedback, and other indications of the
manufacturer's maintenance of the QML system.
3.4.8 Performance requirements for class T devices. The manufacturer of a class T device shall be a certified and qualified
QML manufacturer approved by the QA. The class T devices shall be manufactured on a certified and qualified QML line as
defined in 3.4 herein. The class T flow shall be developed and approved through the manufacturer’s TRB; shall be qualified;
shall be defined in the manufacturer’s QM plan; and be approved by the QA. Each technology flow (e.g., wafer fabrication,
assembly, screening, qualification, TCI, etc.) shall be developed and documented taking into account the application
requirements of the customers. The device manufacturer shall demonstrate that the failure mode and mechanisms of the
technologies are considered when developing the technology flow. Copies of each technology flow, including supporting
documentation, shall be reviewed and approved by the QA prior to listing as an approved source of supply. Any modification
to the approved technology flow shall be reviewed and approved by the TRB and the QA. The technology flow and supporting
documentation shall be made available to the systems manufacturers, the Government, and customers for review. The
customer shall be notified of major changes which affect form, fit, or function of the device defined within the device
specification and the manufacturer’s QM plan. Class T is not for use in NASA manned, satellite, or launch vehicle programs
without written permission from the applicable NASA Project Office (e.g., cognizant EEE parts authority).
10
ACTEL [ Actel Corporation ]
