MIL-PRF-38535K
APPENDIX J
TECHNOLOGY CONFORMANCE INSPECTION AND SCREENING INFORMATION
J.1 SCOPE
J.1.1 Scope. The qualified manufacturer listing (QML) program measures and evaluates the manufacturers'
manufacturing process against a baseline for that process. This baseline can include innovative and improved
processes that result in an equivalent or higher quality product, provided that the process used to evaluate and
document these changes has been reviewed and approved. Changes to the process baseline can be made by the
manufacturer's Technology Review Board (TRB) after achieving QML status with documented reliability and quality
data. The approach outlined in this appendix is a proven baseline which contains details of the screening and
technology conformance inspection (TCI) procedures. This appendix is a mandatory part of the specification. The
information contained herein is intended for compliance. However, for QML microcircuits the manufacturers may
offer approved alternatives that demonstrate a process control system that achieves at least the same level of quality
and reliability as could be achieved by this appendix.
J.2 APPLICABLE DOCUMENTS
J.2.1 General. The documents listed in this section are specified in section J.3 of this appendix. This section does
not include documents cited in other sections of this appendix or recommended for additional information or as
examples. While every effort has been made to ensure the completeness of this list, document users are cautioned
that they must meet all specified requirements of documents cited in section J.3 of this appendix, whether or not they
are listed.
J.2.2 Government documents.
J.2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
- Test Method Standard Microcircuits.
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
J.2.3 Non-Government publications. The following documents form a part of this document to the extent specified
herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
TechAmerica
EIA557
- Statistical Process Control Systems.
(Copies of these documents are available online at http://www.techamerica.org or from TechAmerica,
601 Pennsylvania Ave., NW, North Building, Suite 600, Washington DC 20004-2650.)
JEDEC – SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC)
JEP121
- Requirements for Microelectronic Screening and Test Optimization.
(Copies of these documents are available online at http://www.jedec.org or from JEDEC – Solid State Technology
Association, 3103 North 10th Street, Suite 240–S, Arlington, VA 22201-2107.)
J.2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the
text of this document and the references cited herein(except for related specification sheets), the text of this
document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless
a specific exemption has been obtained.
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ACTEL [ Actel Corporation ]
