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5962-9958502QXC 参数 Datasheet PDF下载

5962-9958502QXC图片预览
型号: 5962-9958502QXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 36000 Gates, 2414-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX H  
H.3.4.1.1 Process technology validation. The manufacturer shall perform sufficient technology qualification testing to  
assure the devices supplied meet the minimum class level B or S performance requirements as described herein. The  
manufacturer shall maintain documentation of qualification testing for review by the preparing or acquiring activity upon request.  
H.3.4.1.2 Technology qualification eligibility. Design, wafer fabrication, assembly, and qualification testing of the  
demonstration vehicles may begin before certification is granted. However, if deficiencies and concerns found during the  
validation require changes to the process flows, the design, wafer fabrication, assembly, and testing shall be redone on the new  
process flows. In all cases, start of the qualification testing should begin no later than 6 months after the letter of certification is  
received in order to retain the manufacturer's initial certification. Completion should be achieved in a timely manner or  
recertification may be necessary.  
H.3.4.1.3 Demonstration vehicles. Demonstration vehicles shall be produced on the certified manufacturing line as  
defined in the QM plan submitted during the certification process. These demonstration vehicles should be of such complexity  
as to be representative of the microcircuits to be supplied by the manufacturer. The demonstration vehicles will be assembled  
in packages that are representative of manufacturer technology and shall be screened to the appropriate QML classes Q or V  
or Y flow, including all applicable test alternatives and test optimizations. Each demonstration vehicle shall operate and meet  
all performance requirements of the device specification and RHACL for a radiation hardened process.  
NOTES: For a technology which has a die as its primary product, the demonstration vehicle should be suitably packaged to  
allow evaluation of the technology without adversely affecting the outcome of the tests.  
H.3.4.2 Technology qualification test plan. The manufacturer shall submit a qualification test plan which details the test  
flow, test limits, test data to be measured, recorded and analyzed, test sampling techniques, and traceability records. The test  
plan should detail materials, manufacturing construction techniques (including design CAD tools), testing and reporting  
techniques and should be made available to the qualifying activity at the time of certification. The test plan should include  
traceability documentation, milestone charts and the proposed demonstration vehicle descriptions. All test limits should be in  
accordance with the requirements of the SMD. All demonstration vehicles shall be representative of the manufacturing and  
screening processes. For class level S product new technology items, the plan shall include any screening tests or additional  
qualification tests required as a result of the characterization and physics-of-failure evaluations.  
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