欢迎访问ic37.com |
会员登录 免费注册
发布采购

5962-9958502QXC 参数 Datasheet PDF下载

5962-9958502QXC图片预览
型号: 5962-9958502QXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 36000 Gates, 2414-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
 浏览型号5962-9958502QXC的Datasheet PDF文件第164页浏览型号5962-9958502QXC的Datasheet PDF文件第165页浏览型号5962-9958502QXC的Datasheet PDF文件第166页浏览型号5962-9958502QXC的Datasheet PDF文件第167页浏览型号5962-9958502QXC的Datasheet PDF文件第169页浏览型号5962-9958502QXC的Datasheet PDF文件第170页浏览型号5962-9958502QXC的Datasheet PDF文件第171页浏览型号5962-9958502QXC的Datasheet PDF文件第172页  
MIL-PRF-38535K  
APPENDIX H  
H.3.1.10 Manufacturer’s Responsibility. It is the manufacturer’s responsibility to ensure all of the defined systems and  
controls are fully implemented and operational as defined in this specification, appendices, and applicable standards and  
specifications. The manufacturer shall provide a focal point representative for the coordination and communication of QML  
program.  
H.3.1.11 Qualifying Activity (QA) Responsibility. The QA is responsible for the coordination between the government  
agencies in the performance of quality audits and report approvals. The QA shall consolidate concerns and observations from  
the various agencies to provide a jointly agreed to position to provide to the manufacturer in addressing audit deficiencies and  
in meeting the specified requirements.  
Any request for data, additional testing, or new manufacturing requirements, for a QML manufacturer, that were not part of  
the QA approved certification, qualification test plan, or DLA Land and Maritime audit results, must be provided to and approved  
by the QA. Supporting data for the request shall also be provided to the QA. Upon approval by the QA, the QA shall submit the  
request or requirement to the QML manufacturer. The QA shall arrange any necessary conference calls or site visits with the  
QML manufacturer.  
H.3.2 Certification.  
H.3.2.1 Design, Wafer Fabrication, Assembly, and Test Certification. The QA shall perform certification validation of the  
Design, Wafer Fabrication, Assembly, and Test capabilities of the manufacturer. The QA validation shall include analysis of  
data, and demonstration of the manufacturer’s capability, to meet the requirements for certification in the following areas:  
H.3.2.1.1 Design. The manufacturer should address the design methodology for the following areas of design.  
NOTE: These are also applicable to third party design centers.  
H.3.2.1.1.1 Circuit design. QML microcircuits should address the circuit design requirements and performance  
characteristics herein:  
a. Model verification. Provide evidence that all models utilized in the design process are functional, predictable, and  
accurate over the worst case temperature and electrical extremes. Examples of these models are: electrical  
(transistor, passives, interconnect, package), behavioral, logic, fault, timing, signal integrity, power estimation and  
thermal conductivity.  
b. Layout verification. Demonstrate the capability of the automated or manual procedures routinely used for design,  
electrical, and reliability rule checking to catch all known errors, singularly and in combination. These rules cover, as a  
minimum:  
(1) Design rules check (DRC): Geometric and physical.  
(2) Electrical rules check (ERC): Shorts and open, connectivity.  
(3) Reliability rules: Electromigration and current density, IR drops, latch-up, single event upset (SEU), hot carrier  
injection (HCI), electrostatic discharge (ESD), burnout backgating (for gallium arsenide (GaAs) technology).  
c. Performance verification. The manufacturer should design and construct a chip or set of chips to assess the process  
capability to perform routing and to accurately predict post-routing performance. The manufacturer should  
demonstrate that the actual measured performance for each function over temperature and voltage falls between the  
two worst case performance limits or is covered by statistical models. All critical minimum geometric and electrical  
design rules should be stressed via devices or structures located on the SEC, TCV, or PMs. The electrical stress  
requirements for the transistors, passive devices and interconnects on these structures should be determined by worst  
case circuit conditions. Failure analysis (FA) should be conducted to identify the failure mechanisms occurring in any  
failed devices and/or structures. Corrections to the design or to the verification/screening method shall be undertaken  
to mitigate any future occurrences of failures. These changes shall be presented to the QA prior to implementation if  
part of a new technology test plan. It is allowed that the manufacturer may choose actual product for their TCV or  
SEC. The manufacturer shall demonstrate burn-in circuits and life test conditions through characterization efforts to  
ensure proper operation at the device specified frequency.  
154  
 
 
 
 
 
 
 
 
 复制成功!