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5962-0822404QZA 参数 Datasheet PDF下载

5962-0822404QZA图片预览
型号: 5962-0822404QZA
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 4000000 Gates, CMOS, CPGA1272, CERAMIC, CGA-1272]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
f. The overall control of the process are under the auspices of a TRB which is established by the manufacturer. The  
TRB is solely responsible for the QML flow that has been certified and qualified.  
g. For RHA devices, procedures and requirements are integrated into this specification for establishing and  
demonstrating a RHACL for the technology. Many device-oriented tests can be reduced or eliminated when  
correlation data for models and test structures have been established by the TRB. The main concern in the RHA  
community is whether the device specification accurately describes the device performance in the radiation  
environment specified. Until such models and test structures are developed, some actual device radiation testing will  
be required.  
h. Appendix B to this specification defines an implementation transition approach which may be used for space or other  
critical environment applications.  
6.6 Additional reference documents. The following documents are not directly referenced herein but should be used as  
guidelines.  
MIL-HDBK-339  
MIL-HDBK-814  
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Custom Large Scale Integrated Circuit Development and Acquisition for Space Vehicles.  
Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and  
Semiconductor Devices.  
MIL-HDBK-815  
MIL-HDBK-816  
MIL-HDBK-817  
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Dose-Rate Hardness Assurance Guidelines.  
Guidelines for Developing Radiation Hardness Assurance Device Specifications.  
System Development Radiation Hardness Assurance.  
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order  
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
ASTM INTERNATIONAL (ASTM)  
ASTM B487  
ASTM B567  
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Standard Test Method for Measurement of Metal and Oxide Coating Thickness by  
Microscopical Examination of a Cross Section.  
Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method.  
(Copies of these documents are available online at http://www.astm.org/ or from ASTM International, 100 Barr Harbor Drive,  
P.O. Box C700, West Conshohocken, PA 19428-2959.)  
JEDEC – SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC)  
JESD541  
JEP95  
JESD16  
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Packaging Material Standards for ESD Sensitive Items.  
JEDEC Registered and Standard Outlines for Solid State and Related Products.  
Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM).  
(Copies of these documents are available online at http://www.jedec.org or from JEDEC – Solid State Technology  
Association, 3103 North 10th Street, Suite 240–S, Arlington, VA 22201-2107.)  
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