MIL-PRF-38535K
INDEX
PARAGRAPH
Country of origin
3.6.5
Country of origin
A.3.6.6
A.3.1.3.28
3.6.6
Custom microcircuit
Date code
Deficiencies and concerns
Definitions
3.4.1.7
A.4.9.2
D.3.1
Definitions
Delta limit
6.4.9
Delta limit (∆)
A.3.1.3.15
C.3.7
Demonstration vehicles
Demonstration vehicles
Design
H.3.4.1.3
C.3.4.1.1
H.3.2.1.1
A.3.5
Design
Design and construction
Design documentation
Design methodology change
Design requirements
Design verification
Design, material, and process change control
A.3.5.4
G.3.4.1
C.4.2
B.3.5
A.4.8.1.1.8
Design, processing, manufacturing equipment, and materials
instructions
A.4.8.1.1.6
A.4.8.1.1
F.4.7.2.3
A.4.3.2.2
A.4.9.3.1.2
A.3.6.2.5
3.6.2.3
Design, processing, manufacturing, and testing instructions
Destructive bond strength
Destructive tests
Deviation from critical documents
Device class
Device class designator
Device specification
Device specification
Device specification
Device type
3.5
A.3.1.3.33
A.3.6.2.3
6.4.15
Device type
A.3.1.3.20
A.3.6.2.4
A.3.4.1.2.3
A.3.2.2.2
A.3.1.3.29
A.3.5.4.2
A.3.5.7
Device type
Die attachment
Die evaluation requirements
Die family
Die intraconnection pattern
Die plating and mounting
Die thickness
A.3.5.9
Die to terminal interconnection
Die topography
A.3.5.4.3
A.3.5.4.1
6.4.16
Die type
Die type
A.3.1.3.21
189