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5962-0421901QUA 参数 Datasheet PDF下载

5962-0421901QUA图片预览
型号: 5962-0421901QUA
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 250000 Gates, CMOS, CPGA624, CERAMIC, CGA-624]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX A  
A.4.5.8 Nonconformance. Lots that fail subgroup requirements of groups B, C, and D (and E if applicable) may be  
resubmitted in accordance with the provisions of A.4.3.3.1. A failed lot that is reworked (see A.3.7.1) or is rescreened  
(resubmittal to inadvertently missed process steps is not considered a rescreen) may not be resubmitted to the failed  
subgroups (and shall be counted as a failure) for periodic group B, C, or D (or E if applicable) quality conformance  
inspection (QCI) coverage. The lot may be resubmitted only to the failed subgroup to determine its own acceptance.  
If a lot is not resubmitted or fails the resubmission, the lot shall not be shipped, and all references to MIL-PRF-38535,  
or this appendix, shall be removed. For RHA microcircuits where group E tests are performed, and a sample plan of  
18(1) and 38(1) is utilized for two successive lots of the same device type or for more than 10 percent of the lots  
during the preceding 18 months, data as specified herein shall be provided. Resubmission for RHA qualification  
inspection, in this case, may be required. Lots that are not resubmitted, fail the resubmission, are withdrawn from  
compliance consideration, reworked, or rescreened (excluding resubmittal to final electricals when test conditions or  
limits are not changed) due to the failure of a PDA or QCI requirement of this appendix shall be recorded and  
properly dispositioned. The reporting of these lots shall include the following, as applicable:  
a. PIN.  
b. Inspection lot identification code.  
c. Quantity of lot.  
d. Point of scrap in manufacturer's flow.  
e. Test results and date of failure (including all rescreening, reworks, and resubmissions).  
f. Reason for failure or scrapping including applicable test results.  
g. Date of scrapping or withdrawal from military consideration.  
h. Disposition action of affected lots.  
NOTE: The Government reserves the right to request and receive information concerning implementation of  
corrective actions and justification for rework and rescreening.  
A.4.5.8.1 Group B failure. When a lot failure occurs for a group B subgroup, then all other sublots within the  
inspection lots shall be submitted to the failed subgroup.  
A.4.5.8.2 Alternate group B failure. When a failure has occurred in group B using the alternate group B procedure,  
samples from three additional inspection lots of the same package type, lead finish and week of seal as the failed  
package shall be tested to the failed subgroups. If all three inspection lots pass, then all devices manufactured on  
the same assembly line using the same package type and lead finish and sealed in the same week may be accepted  
for group B inspection. If one or more of the three additional inspection lots fails, then no inspection lot containing  
devices manufactured on the same assembly line using the same package type and lead finish sealed in the same  
week shall be accepted for group B inspection until each inspection lot has been subjected to and passed the failed  
subgroups.  
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