MIL-PRF-38535K
JAN
- Joint Army Navy
JEDEC
JEP
- (Formerly known as Joint Electronic Device Engineering Council)
- JEDEC publication
JESD
JTAG
LET
- JEDEC standard
- Joint Test Action Group
- linear energy transfer
LETTH
MIL
- linear energy transfer threshold
- military
MOS
MTTF
NASA
NDBP
OEM
PDA
PIN
- metal oxide semiconductor
- mean time to failure
- National Aeronautics and Space Administration
- nondestructive bond pull
- original equipment manufacturer
- percent defective allowable
- part or identifying number
- Package integrity demonstration test plan
- particle impact noise detection
- post - irradiation parameter limits
- programmable logic array
- parametric monitor
PIDTP
PIND
PIPL
PLA
PM
PPM
PROM
QA
- parts per million
- programmable read only memory
- qualifying activity
QAR
QCI
- quality assurance representative
- quality conformance inspection
- quality management
QM
QML
QPL
- qualified manufacturer listing
- qualified products list
RAM
RH
- random access memory
- relative humidity
RHA
RHACL
RMS
ROM
RSS
SAE
SEC
SEE
SEM
SEP
SEU
SMD
- radiation hardness assurance
- radiation hardness assurance capability level
- root mean square
- read only memory
- radiation source of supply
- Society of Automotive Engineers
- standard evaluation circuit
- single event effects
- scanning electron microscope
- single event phenomenon
- single event upset
- Standard Microcircuit Drawing
44
ACTEL [ Actel Corporation ]
