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5962-0150805QYX 参数 Datasheet PDF下载

5962-0150805QYX图片预览
型号: 5962-0150805QYX
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 32000 Gates, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
6.4.27 Class M. Items which have been subjected to and passed all applicable requirements of appendix A herein and are  
documented on an SMD. This product is intended for military applications.  
6.4.28 Class N. Items which have been subjected to and passed all applicable requirements of this specification including  
qualification testing, screening testing, and TCI/QCI inspections, and are encapsulated in plastic. This product must be  
assessed by the user to determine if it is appropriate for use in users’ application.  
6.4.29 Class Q. Items which have been subjected to and passed all applicable requirements of this specification and  
applicable appendices including qualification testing, screening testing, and TCI/QCI inspections.  
6.4.30 Class V. Items that meet all the class Q requirements, and have been subjected to, and passed all applicable  
requirements of appendix B herein.  
6.4.31 Class Y. A microcircuit employing a ceramic non-hermetic package, which meets all applicable requirements of this  
specification including qualification, screening and TCI/QCI requirements, and all applicable requirements of Appendix B  
herein.  
6.4.32 Class B. Items which have been subjected to and passed all applicable requirements of this specification including  
qualification testing, screening testing, and TCI/QCI inspections and are documented on a MIL-M-38510 specification sheet.  
6.4.33 Class S. Items that meet all the class B requirements, and have been subjected to, and passed, all applicable  
requirements of appendix B herein and are documented on a MIL-M-38510 specification sheet.  
6.4.34 Class T. Class T is a quality level whose requirements are defined by 3.4.8 herein and as documented on an SMD.  
Class T is not for use in NASA manned, satellite, or launch vehicle programs without written permission from the applicable  
NASA Project Office (e.g., cognizant EEE parts authority).  
6.4.35 Qualified manufacturer’s line. The specified line, which is the certified and qualified technology flow, of a  
manufacturer from which QML integrated circuits may be purchased.  
6.4.36 Test optimization. The process used by the manufacturer to optimize testing utilizing the best commercial practices  
available while still assuring all applicable performance, quality, and reliability requirements are met. Any screen or TCI test  
prescribed herein may be reduced, modified, moved, or eliminated by the QML manufacturer provided the product is still  
capable of meeting the screening and TCI testing groups A, B, C, D, and E for the applicable detail specification as approved  
by the QA.  
6.4.37 Audit team. The audit team will be led by DLA Land and Maritime personnel and comprised of government  
representatives (e.g., NASA, NRO, ARMY, NAVY, USAF and DTRA) as designated by the qualifying activity.  
6.4.38 Class level B. Class level B requirements contained in this document define the requirements for class Q and class  
B, including SMDs and M38510 JAN slash sheet product. Class level B is the standard military quality level, it is intended for  
high reliability military applications.  
6.4.39 Class level S. Class level S requirements contained in this document define the requirements for class V, class Y  
(class level S) (Space level product), including SMDs and M38510 JAN slash sheet product. Class level S is the highest  
reliability level provided for in this specification, it is intended for space applications.  
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