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5962-0422104QUC 参数 Datasheet PDF下载

5962-0422104QUC图片预览
型号: 5962-0422104QUC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 2000000 Gates, 32256-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
INDEX  
PARAGRAPH  
Discontinuation of products  
Discussion  
3.3.4.1  
6.5  
Disposal of samples  
Dissipative  
A.4.3.2.1  
A.3.1.3.25  
A.4.1.6  
3.6.2.2  
A.3.6.2.8  
A.4.3.6  
A.3.2.1  
6.4.18  
Distributor inventory, traceability and handling control  
Drawing designator  
Drawing designator  
Electrical test equipment verification  
Electrical test requirements  
Electrostatic discharge (ESD) sensitivity  
Electrostatic discharge (ESD) sensitivity  
Electrostatic discharge (ESD) sensitivity identifier  
Electrostatic discharge (ESD) sensitivity identifier  
Electrostatic discharge (ESD) sensitivity  
Electrostatic discharge (ESD) sensitivity  
Element (of a microcircuit or integrated circuit)  
Element (of a microcircuit or integrated circuit)  
Encapsulant  
A.4.4.2.8  
3.6.7.2  
A.3.6.9.2  
4.2.3  
A.3.1.3.27  
6.4.2  
A.3.1.3.2  
F.4.5  
End of line TCI testing (option 1)  
J.3.10.7  
C.4.4.1  
End point tests for group E  
End point tests for groups B, C, and D (and E if applicable)  
inspections  
A.4.5.7  
J.3.10.6  
J.3.10  
End point tests for groups C, D, (E if applicable)  
End-of-line TCI (option 1)  
End-of-line technology conformance inspection (TCI) testing  
(option 1)  
C.4.4  
Environmentally preferable material  
Equipment calibrations  
ESD control  
6.9  
A.4.8.1.2.5  
3.12  
ESD handling control program  
Example C of C  
A.4.8.1.1.14  
A.3.2.2.1  
A.4.8.1.3.8  
Examples of design and construction baseline  
Examples of design, material, equipment, visual standard,  
and process instructions  
A.4.8.1.3.4  
A.4.8.1.3.2  
A.4.8.1.3.5  
A.4.8.1.3.7  
F.4.6.6  
Examples of manufacturing flowchart  
Examples of records  
Examples of travelers  
External visual  
External visual screen  
A.4.6.2  
Fabrication process change  
G.3.4.2  
Failure analysis of burn in screen failures for class level S  
devices  
A.4.6.1.2.1  
A.4.3.5.3  
Failure and corrective action reports  
Failure and defect analysis and feedback  
Failure and defect reports and analyses  
A.4.8.1.1.10  
A.4.8.1.2.3  
190  
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