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5962-0422103QXC 参数 Datasheet PDF下载

5962-0422103QXC图片预览
型号: 5962-0422103QXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 2000000 Gates, 32256-Cell, CMOS, CQFP352, CERAMIC, QFP-352]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
This specification is approved for use by all Departments and Agencies of the Department of Defense.  
This document is a performance specification. It is intended to provide the device manufacturers an acceptable  
established baseline in order to support Government microcircuit application and logistic programs. The basic  
section of this specification has been structured as a performance specification, which is supplemented with detailed  
appendices. These appendices provide guidance to manufacturers on demonstrated successful approaches to  
meeting military performance needs. These appendices are included as a benchmark and are intended to impose  
performance requirements. For QML microcircuits the manufacturer is required to develop a program plan that  
meets or exceeds the performance detailed in these appendices (see appendices A, G, H, and J). Appendix A is  
mandatory for manufacturers of device types supplied in compliance with MIL-STD-883 and forms the basis for QML  
classes Q, V and Y. Appendix B is intended for space application and is required for class V and class Y (class level  
S) devices. Appendix C is mandatory for devices requiring radiation hardness assurance (RHA). Appendix D is  
mandatory for statistical sampling, life test, and qualification procedures used with microcircuits.  
1. SCOPE  
1.1 Scope. This specification establishes the general performance requirements for integrated circuits or  
microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition. The  
intent of this specification is to allow the device manufacturer the flexibility to implement best commercial practices to  
the maximum extent possible while still providing product that meets military performance needs. Detail  
requirements, specific characteristics of microcircuits, and other provisions which are sensitive to the particular use  
intended will be specified in the device specification. Quality assurance requirements outlined herein are for all  
microcircuits built on a manufacturing line which is controlled through a manufacturer's quality management (QM)  
program and has been certified and qualified by the Qualifying Activity (QA) in accordance with requirements herein.  
Several levels of product assurance including RHA are provided for in this specification. The certification and  
qualification sections found herein outline the requirements to be met by a manufacturer to be listed on a Qualified  
Manufacturer Listing (QML). After listing of a technology flow on a QML, the manufacturer is to continually meet or  
improve the established baseline of certified and qualified procedures, the QM program, the manufacturer's review  
system, the status reporting, and quality and reliability assurance requirements for all QML products. The  
manufacturer may present alternate methods of addressing the requirements contained in this specification. These  
alternate methods will be approved by the Qualifying Activity. This specification requires a manufacturer to establish a  
process flow baseline. If sufficient quality and reliability data is available, the manufacturer, through the QM program  
and the manufacturer's review system, may modify, substitute, or delete tests. Additional information on the QML  
process and its philosophy is available in 6.5 herein. Class T is not for use in National Aeronautics and Space  
Administration (NASA) manned, satellite, or launch vehicle programs without written permission from the applicable  
NASA project office (e.g., cognizant electrical, electronic, and electromechanical (EEE) parts authority).  
2. APPLICABLE DOCUMENTS  
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This  
section does not include documents cited in other sections of this specification or recommended for additional  
information or as examples. While every effort has been made to ensure the completeness of this list, document  
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this  
specification, whether or not they are listed.  
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