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5962-0151801QYC 参数 Datasheet PDF下载

5962-0151801QYC图片预览
型号: 5962-0151801QYC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 32000 Gates, 206MHz, 2880-Cell, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
TABLE IA. Screening procedure for hermetic classes Q, V and non-hermetic class Y microcircuits.  
MIL-STD-883, test method (TM) and conditions  
Screening Tests  
Class Q  
Class V  
Class Y  
(class level B)  
(class level S)  
(class level S)  
1. Wafer lot acceptance test  
QM plan (see H.3.2.1.4) 1/  
QM plan (see H.3.2.1.4) 1/  
QM plan  
(see H.3.2.1.4) 1/  
or  
or  
TM 5007 of MIL-STD-883  
(all lots)  
TM 5007 of MIL-STD-883  
(all lots)  
2. Nondestructive bond pull (NDBP) test  
2/  
TM 2023  
TM 2023  
TM 2010, condition B  
TM 2010, condition A  
TM 2010, condition A  
3. Internal visual inspection  
3/  
4. Temperature cycling  
4/  
TM 1010, condition C,  
10 cycles minimum  
TM 1010, condition C,  
10 cycles minimum  
TM 1010, condition C,  
10 cycles minimum  
5. Constant acceleration 5/  
TM 2001, condition E  
(minimum), Y1 orientation  
only  
TM 2001, condition E  
(minimum), Y1 orientation  
only  
TM 2001, condition E  
(minimum), Y1 orientation  
only  
6. Visual inspection  
6/  
100%  
100%  
100%  
7. Particle Impact Noise Detection  
TM 2020, test condition A  
on each device  
TM 2020, test condition A  
on each device  
(PIND) test  
7/ 8/  
9/  
8. Serialization  
In accordance with device In accordance with device  
specification (100%) specification (100%)  
In accordance with device  
specification (100%)  
9. Pre burn-in (Interim) electrical  
In accordance with device In accordance with device  
In accordance with device  
specification 12/  
parameters test  
10/  
specification 11/  
specification 12/  
10. Burn-in test:  
10/ 13/ 14/  
TM 1015  
160 hours at +125°C  
minimum  
TM 1015  
240 hours at 125°C,  
condition D 15/  
TM 1015  
240 hours at 125°C ,  
condition D 15/  
11. Post burn-in (Interim) electrical  
parameters test 10/  
In accordance with device  
specification 12/  
In accordance with device  
specification 12/  
12. Reverse bias burn-in test  
(Static burn-in)  
TM 1015, Condition A or C;  
144 hours at +125°C or  
TM 1015, Condition A or C;  
144 hours at +125°C or  
13/ 14/ 16/  
72 hours at +150°C minimum 72 hours at +150°C minimum  
13. Post burn-in (Interim-reverse bias)  
electrical parameters test 10/  
In accordance with device  
specification 12/  
In accordance with device  
specification 12/  
18