5. Performance
5-1.Maximum Rating
Rating
Value
10
Unit
dBm
V
Input Power Level
DC Voltage
Pin
VDC
Tstg
TA
12
Storage Temperature Range
Operating Temperature Range
-40 to +90
-40 to +90
°C
°C
5-2.Electronic Characteristics (@25 ℃)
Characteristic
Minimum
Typical
Maximum
Unit
Center Frequency
(center frequency between 3dB points)
fC
IL
868.69
MHz
Insertion Loss
--
3.8
1.9
5.0
dB
868.39 …. 868.99 MHz
3dB Pass Bandwidth
BW3
MHz
Relative Attenuation (relative to IL)
10.00 …. 700.00 MHz
±
rel
50
33
23
15
30
55
38
28
20
35
--
--
--
--
--
dB
dB
dB
dB
dB
700.00 …. 830.00 MHz
830.00 …. 863.00 MHz
873.00 …. 880.00 MHz
880.00 …. 1000.0 MHz
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling!
NOTE:
1. The frequency fC is defined as the midpoint between the 3dB frequencies.
2. Unless noted otherwise, all measurements are made with the filter installed in the specified test fixture that is
connected to a 50© test system with VSWRd1.2:1. The test fixture L and C are adjusted for minimum insertion
loss at the filter center frequency, fC. Note that insertion loss, bandwidth, and passband shape are dependent on
the impedance matching component values and quality.
3. Unless noted otherwise, specifications apply over the entire specified operating temperature range.
4. Frequency aging is the change in fC with time and is specified at +65°C or less. Aging may exceed the
specification for prolonged temperatures above +65°C. Typically, aging is greatest the first year after manufacture,
decreasing in subsequent years.
5. Turnover temperature, T0, is the temperature of maximum (or turnover) frequency, f0. The nominal frequency at
any case temperature, TC, may be calculated from: f = f0 [1 - FTC (T0 - TC)2].
6. The specifications of this device are based on the test circuit shown above and subject to change or obsolescence
without notice.
7. All equipment designs utilizing this product must be approved by the appropriate government agency prior to
manufacture or sale.
Iss 1 C1u
Date 23-6-2011
ACT [ ADVANCED CRYSTAL TECHNOLOGY ]
