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WFF12N60 参数 Datasheet PDF下载

WFF12N60图片预览
型号: WFF12N60
PDF下载: 下载PDF文件 查看货源
内容描述: 硅N沟道MOSFET [Silicon N-Channel MOSFET]
分类和应用:
文件页数/大小: 7 页 / 456 K
品牌: WINSEMI [ SHENZHEN WINSEMI MICROELECTRONICS CO., LTD ]
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WFF12N60  
Electrical Characteristics (Tc = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
IGSS  
Test Condition  
VGS = ±30 V, VDS = 0 V  
IG = ±10 μA, VDS = 0 V  
VDS = 600 V, VGS = 0 V  
ID = 250 μA, VGS = 0 V  
Min  
-
Type  
Max  
Unit  
nA  
V
-
-
-
-
±100  
Gate−source breakdown voltage  
Drain cut−off current  
V(BR)GSS  
IDSS  
±30  
-
-
1
-
μA  
V
Drain−source breakdown voltage  
V(BR)DSS  
600  
ΔBVDSS  
ΔTJ  
/
Break Voltage Temperature  
Coefficient  
ID=250μA, Referenced to 25℃  
V/℃  
-
0.5  
-
Gate threshold voltage  
Drain−source ON resistance  
Forward Transconductance  
Input capacitance  
VGS(th)  
RDS(ON)  
gfs  
VDS = 10 V, ID =250 μA  
VGS = 10 V, ID =6.0A  
VDS = 50 V, ID =6.0A  
VDS = 25 V,  
3
-
-
-
-
-
-
-
-
-
-
-
4.5  
V
S
0.65  
15  
Ciss  
Crss  
Coss  
tr  
1790  
175  
23  
2355  
232  
31  
Reverse transfer capacitance  
Output capacitance  
VGS = 0 V,  
pF  
f = 1 MHz  
Turn−on Rise time  
133  
80  
175  
100  
160  
310  
VDD =300 V,  
ID =12 A  
Turn−on Delay time  
Switchi  
ton  
ns  
RG=9.1 Ω  
Turn−off Fall time  
ng time  
tf  
100  
233  
RD=31 Ω  
(Note4,5)  
(Note4,5)  
Turn−off Delay time  
toff  
Total gate charge (gate−source  
plus gate−drain)  
Qg  
-
39  
52  
VDD = 400 V,  
VGS = 10 V,  
ID =1 A  
nC  
Gate−source charge  
Qgs  
Qgd  
-
-
8.5  
19  
-
-
Gate−drain (“miller”) Charge  
Source−Drain Ratings and Characteristics (Ta = 25°C)  
Characteristics  
Continuous drain reverse current  
Pulse drain reverse current  
Forward voltage (diode)  
Symbol  
IDR  
Test Condition  
Min  
Type  
Max  
12  
48  
1.4  
-
Unit  
A
-
-
-
-
-
-
-
-
-
IDRP  
VDSF  
trr  
A
IDR = 12 A, VGS = 0 V  
IDR = 12 A, VGS = 0 V,  
dIDR / dt = 100 A / μs  
-
V
Reverse recovery time  
418  
4.85  
ns  
Reverse recovery charge  
Qrr  
-
μC  
Note 1.Repeativity rating :pulse width limited by junction temperature  
2.L=11.2mH,IAS=12A,VDD=50V,RG=25Ω,Starting TJ=25℃  
3.ISD≤12A,di/dt≤300A/us, VDD<BVDSS,STARTING TJ=25℃  
4.Pulse Test: Pulse Width≤300us,Duty Cycle≤2%  
5.Essentially independent of operating temperature.  
This transistor is an electrostatic sensitive device  
Please handle with caution  
2/7  
Copyright @ WinSemi Semiconductor Co., Ltd., All rights reserved.