欢迎访问ic37.com |
会员登录 免费注册
发布采购

25M02GWTCIT 参数 Datasheet PDF下载

25M02GWTCIT图片预览
型号: 25M02GWTCIT
PDF下载: 下载PDF文件 查看货源
内容描述: [1.8V 2G-BIT (2 x 1G-BIT) SERIAL SLC NAND FLASH MEMORY WITH]
分类和应用:
文件页数/大小: 68 页 / 2317 K
品牌: WINBOND [ WINBOND ]
 浏览型号25M02GWTCIT的Datasheet PDF文件第3页浏览型号25M02GWTCIT的Datasheet PDF文件第4页浏览型号25M02GWTCIT的Datasheet PDF文件第5页浏览型号25M02GWTCIT的Datasheet PDF文件第6页浏览型号25M02GWTCIT的Datasheet PDF文件第8页浏览型号25M02GWTCIT的Datasheet PDF文件第9页浏览型号25M02GWTCIT的Datasheet PDF文件第10页浏览型号25M02GWTCIT的Datasheet PDF文件第11页  
W25M02GW  
1. GENERAL DESCRIPTIONS  
The W25M02GW (2 x 1G-bit) Serial MCP (Multi Chip Package) Flash memory is based on the W25N Serial  
SLC NAND SpiFlas h® series by stacking two individual W25N01GW die into a standard 8-pin package. It  
offers the highest memory density for the low pin-count package, as well as Concurrent Operations in Serial  
Flash memory for the first time. The W25M SpiStack® series is ideal for small form factor system designs,  
and applications that demand high Program/Erase data throughput. All W25N SpiFlash family devices are  
offered in space-saving packages which were impossible to use in the past for the typical NAND flash  
memory.  
The SpiStack® product series introduces a new “Software Die Select (C2h)” instruction, and a factory  
assigned “Die ID#” for each stacked die. Each W25N01GW die can be accessed independently even  
though the interface is shared. The SpiStack® feature only allows a single die to be Active and have control  
of the SPI interface at any given time to avoid bus contention.  
The W25M02GW supports the standard Serial Peripheral Interface (SPI), Dual/Quad I/O SPI: Serial Clock,  
Chip Select, Serial Data I/O0 (DI), I/O1 (DO), I/O2 (/WP), and I/O3 (/HOLD). SPI clock frequencies of up to  
104MHz are supported allowing equivalent clock rates of 208MHz (104MHz x 2) for Dual I/O and 416MHz  
(104MHz x 4) for Quad I/O when using the Fast Read Dual/Quad I/O instructions.  
The W25M02GW provides a new Continuous Read Mode that allows for efficient access to the entire  
memory array with a single Read command. This feature is ideal for code shadowing applications.  
Additionally, the device supports JEDEC standard manufacturer and device ID, one 2,048-Byte Unique ID  
page, one 2,048-Byte parameter page and ten 2,048-Byte OTP pages. To provide better NAND flash  
memory manageability, user configurable internal ECC, bad block management are also available in  
W25M02GW.  
2. FEATURES  
New Family of SpiFlash Memories  
W25M02GW: 2x1G-bit / 2x128M-Byte  
Standard SPI: CLK, /CS, DI, DO, /WP, /HOLD  
Dual SPI: CLK, /CS, IO0, IO1, /WP, /HOLD  
Quad SPI: CLK, /CS, IO0, IO1, IO2, IO3  
Compatible SPI serial flash commands  
Low Power, Wide Temperature Range  
Single 1.70 to 1.95V supply  
25mA active, 20µA standby current  
-40°C to +85°C operating range  
Flexible Architecture with 128KB blocks  
Uniform 128K-Byte Block Erase  
Flexible page data load methods  
Highest Performance Serial NAND Flash  
104MHz Standard/Dual/Quad SPI clocks  
208/416MHz equivalent Dual/Quad SPI  
40MB/S continuous data transfer rate  
Fast Program/Erase performance  
Advanced Features  
On chip 1-Bit ECC for memory array  
ECC status bits indicate ECC results  
bad block management and LUT(2) access  
Software and Hardware Write-Protect  
Power Supply Lock-Down and OTP protection  
2KB Unique ID and 2KB parameter pages  
Ten 2KB OTP pages(3)  
More than 100,000 erase/program cycles  
More than 10-year data retention  
Efficient “Continuous Read Mode(1)  
Alternative method to the Buffer Read Mode  
– No need to issue “Page Data Read” between  
Read commands  
Space Efficient Packaging  
8-pad WSON 8x6-mm  
24-ball TFBGA 8x6-mm  
Contact Winbond for other package options  
Notes:  
1. Only the Read command structures are different  
between the “Continuous Read Mode” and the “Buffer  
Read Mode”, all other commands are identical.  
Allows direct read access to the entire array  
Flexible “Concurrent Operations”  
Independent single die access  
– Allows “Read while Program/Erase”  
– Allows “Multi Die Program/Erase”  
Improves Program/Erase throughput  
2. LUT stands for Look-Up Table.  
3. OTP pages can only be programmed.  
Publication Release Date: March 08, 2017  
Preliminary - Revision B  
- 6 -