XBS304S19R-G
■TEST
CIRCUITS
LCR Meter
Bias
Device Under test
Pulse Generatrix
Oscilloscope
■NOTES
ON USE
1） Please use this IC within the absolute maximum ratings.
2） Even within the ratings, in case of high load use continuously such as high temperature, high voltage, high current and
thermal stress may cause reliability degradation of the IC. Adequate “Derating” should be taken into consideration while
designing.
3） Torex places an importance on improving our products and their reliability. We request that users incorporate fail-safe
designs and post-aging protection treatment when using Torex products in their systems.
2/4
TOREX [ TOREX SEMICONDUCTOR ]
