4. Reliability Tests
Item
Condition
Note
Failures
0/22
Life Test
Ta = RT, IF = 30mA
Ta = 85ºC, IF = 8mA
Ta = -30ºC, IF = 20mA
1000hrs
1000hrs
1000hrs
High Temperature Operating
Low Temperature Operating
Thermal Shock
0/22
0/22
Ta = -40ºC (30min) ~ 100º (30min)
100
0/40
(Transfer time : 10sec, 1Cycle = 1hr)
cycles
Resistance to soldering Heat
Ts = 255 ± 5ºC, t = 10sec
1kV, 1.5kΩ ; 100pF
1 time
1 time
0/22
ESD
0/22
(Human Body Model)
High Temperature Storage
Low Temperature Storage
Ta = 100ºC
Ta = -40ºC
1000hrs
1000hrs
1000hrs
0/22
0/22
0/22
Temperature Humidity
Storage
Ta = 85ºC, RH = 85%
Temperature Humidity
Operating
Ta = 85ºC, RH = 85%, IF = 8mA
100hrs
0/22
< Judging Criteria For Reliability Tests >
VF
IR
USL[1] X 1.2
USL X 2.0
LSL [2] X 0.5
ФV
Notes :
[1] USL : Upper Standard Level
[2] LSL : Lower Standard Level.
Rev. 00
December 2007
www.ZLED.com
Document No. : SSC-QP-7-07-24 (Rev.00)
<080924> Rev. 0.1
SEOUL [ Seoul Semiconductor ]
