4. Reliability Tests
Item
Condition
Note
Failures
Life Test
Ta = RT, IF = 40mA
Ta = 85ºC, IF = 10mA
Ta = -30ºC, IF = 40mA
1000hrs
1000hrs
1000hrs
0/22
0/22
0/22
0/40
0/22
0/22
High Temperature Operating
Low Temperature Operating
Thermal Shock
Ta = -40ºC (15min) ~ 100º (15min)
100
(Transfer time : 10sec, 1Cycle = 30min)
cycles
Resistance to soldering Heat
Ts = 235 ± 5ºC, t = 4 ± 1sec
1kV, 1.5kΩ ; 100pF
1 time
1 time
ESD
(Human Body Model)
High Temperature Storage
Low Temperature Storage
Ta = 100ºC
1000hrs
0/22
Ta = -40ºC
1000hrs
1000hrs
0/22
0/22
Temperature Humidity
Storage
Ta = 85ºC, RH = 85%
Temperature Humidity
Operating
Ta = 85ºC, RH = 85%, IF = 10mA
500hrs
0/22
< Judging Criteria For Reliability Tests >
VF
IR
USL[1] X 1.2
USL X 2.0
LSL [2] X 0.5
ФV
Notes :
[1] USL : Upper Standard Level
[2] LSL : Lower Standard Level.
Rev. 00
December 2007
www.ZLED.com
<080612> Rev. 1.5
SEOUL [ Seoul Semiconductor ]
