OS-CON DATA SHEET
SVP series
Test item
Endurance
Test temperature
105 deg.C
Model
10SVP33M
041902081
(After V.P.S test)
Applied voltage
10 V
Lot No.
Tangent of loss angle (120Hz)
Change in capacitance (120Hz)
0.15
0.14
0.13
0.12
0.11
0.1
20
10
0
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
-10
-20
-30
-40
0
2000
0
2000
Time[h]
Time[h]
Leakage current (10V 60s)
ESR (100kHz)
200
180
160
140
120
100
80
10000
1000
100
10
1
60
40
0.1
20
0.01
0
0
2000
0
2000
Time[h]
Time[h]
Note:
n =30p.
Note: V.P.S test conditions : 230deg.C×75s×2times
(V.P.S = Vapor Phase Soldering method)
Start on June 5, 2000
End on August 31, 2000
Executed by M. Koyama
Drawn by M. Kimura
No.OS02D-DESVP011
OS Engineering Department, OS-CON Control Department, Saga SANYO Industries Co., Ltd.
SANYO [ SANYO SEMICON DEVICE ]
