REI Datasheet
SN5473, SN54H73, SN54L73, SN54LS73A
SN7473, SN74H73, SN74LS73A
Dual J-K Flip-Flops with Clear
The ‘73, ‘H73, and ‘L73 contain two independent J-K flip-flops with individual J-K, clock, and direct
clear inputs. The ‘73, ‘H73, and ‘L73 are positive pulse-triggered flip-flops. J-K input is loaded into
the master while the clock is high and transferred to the slave on the high-to-low transition. For these
devices the J and K inputs must be stable while the clock is high.
The ‘LS73A contain two independent negative-edge-triggered flip-flops. The J and K inputs must be
stable one setup time prior to the high-to-low clock transition for predictable operation. When the
clear is low, it overrides the clock and data inputs forcing the Q output low and the Q output high.
Rochester Electronics
Manufactured Components
Rochester branded components are
manufactured using either die/wafers
purchased from the original suppliers
or Rochester wafers recreated from the
original IP. All recreations are done with
the approval of the OCM.
Parts are tested using original factory
test programs or Rochester developed
test solutions to guarantee product
meets or exceeds the OCM data sheet.
Quality Overview
•
ISO-9001
• AS9120 certification
• Qualified Manufacturers List (QML) MIL-PRF-38535
• Class Q Military
• Class V Space Level
• Qualified Suppliers List of Distributors (QSLD)
• Rochester is a critical supplier to DLA and
meets all industry and DLA standards.
Rochester Electronics, LLC is committed to supplying
products that satisfy customer expectations for
quality and are equal to those originally supplied by
industry manufacturers.
The original manufacturer’s datasheet accompanying this document reflects the performance
and specifications of the Rochester manufactured version of this device. Rochester Electronics
guarantees the performance of its semiconductor products to the original OEM specifications.
‘Typical’ values are for reference purposes only. Certain minimum or maximum ratings may be
based on product characterization, design, simulation, or sample testing.
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