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2N6508T 参数 Datasheet PDF下载

2N6508T图片预览
型号: 2N6508T
PDF下载: 下载PDF文件 查看货源
内容描述: [25 A, 600 V, SCR, TO-220AB, CASE 221A-07, 4 PIN]
分类和应用: 局域网栅极
文件页数/大小: 15 页 / 816 K
品牌: ROCHESTER [ Rochester Electronics ]
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Preferred Device  
Reverse Blocking Thyristors  
Designed primarily for half-wave ac control applications, such as  
motor controls, heating controls and power supply crowbar circuits.  
Glass Passivated Junctions with Center Gate Fire for Greater  
Parameter Uniformity and Stability  
http://onsemi.com  
Small, Rugged, Thermowatt Constructed for Low Thermal  
Resistance, High Heat Dissipation and Durability  
Blocking Voltage to 800 Volts  
SCRs  
25 AMPERES RMS  
50 thru 800 VOLTS  
300 A Surge Current Capability  
Device Marking: Logo, Device Type, e.g., 2N6504, Date Code  
G
A
K
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Rating  
Symbol  
Value  
Unit  
(1)  
*Peak Repetitive Off–State Voltage  
V
Volts  
DRM,  
(Gate Open, Sine Wave 50 to 60 Hz,  
V
RRM  
T = 25 to 125°C)  
J
4
2N6504  
2N6505  
2N6507  
2N6508  
2N6509  
50  
100  
400  
600  
800  
On-State RMS Current  
(180° Conduction Angles; T = 85°C)  
I
25  
A
A
A
1
T(RMS)  
2
C
3
Average On-State Current  
(180° Conduction Angles; T = 85°C)  
I
T(AV)  
16  
TO–220AB  
CASE 221A  
STYLE 3  
C
Peak Non-repetitive Surge Current  
8.3 ms  
I
TSM  
300  
(1/2 Cycle, Sine Wave 60 Hz, T = 85°C)  
1.5 ms  
J
PIN ASSIGNMENT  
Cathode  
350  
20  
1
2
3
4
Forward Peak Gate Power  
P
Watts  
Watts  
A
GM  
Anode  
(Pulse Width 1.0 µs, T = 85°C)  
C
Gate  
Forward Average Gate Power  
P
0.5  
2.0  
G(AV)  
Anode  
(t = 8.3 ms, T = 85°C)  
C
Forward Peak Gate Current  
I
GM  
(Pulse Width 1.0 µs, T = 85°C)  
C
ORDERING INFORMATION  
Operating Junction Temperature Range  
Storage Temperature Range  
T
40 to  
+125  
°C  
J
Device  
2N6504  
Package  
TO220AB  
TO220AB  
TO220AB  
TO220AB  
TO220AB  
Shipping  
500/Box  
500/Box  
500/Box  
500/Box  
500/Box  
T
40 to  
+150  
°C  
stg  
2N6505  
2N6507  
2N6508  
2N6509  
*Indicates JEDEC Registered Data  
(1) V  
DRM  
and V for all types can be applied on a continuous basis. Ratings  
RRM  
apply for zero or negative gate voltage; however, positive gate voltage shall  
not be applied concurrent with negative potential on the anode. Blocking  
voltages shall not be tested with a constant current source such that the  
voltage ratings of the devices are exceeded.  
Preferred devices are recommended choices for future use  
and best overall value.  
Semiconductor Components Industries, LLC, 1999  
1
Publication Order Number:  
February, 2000 – Rev. 3  
2N6504/D