Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Case Temperature (TC)
Military
−55˚C to +125˚C
−5.7V to −4.2V
Storage Temperature (TSTG
)
−65˚C to +150˚C
Supply Voltage (VEE
)
Maximum Junction Temperature (TJ)
Ceramic
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
+175˚C
−7.0V to +0.5V
VEE to +0.5V
−50 mA
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Output Current (DC Output HIGH)
ESD (Note 2)
≥2000V
Military Version
DC Electrical Characteristics
=
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND, TC −55˚C to +125˚C
Symbol
Parameter
Min
Max Units
TC
Conditions
Notes
VOH
Output HIGH Voltage
−1025 −870
−1085 −870
−1830 −1620
−1830 −1555
−1035
mV
mV
mV
mV
mV
mV
mV
mV
mV
0˚C to +125˚C
−55˚C
=
VIN VIH (Max) Loading with
(Notes 3, 4,
5)
VOL
VOHC
VOLC
VIH
VIL
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
0˚C to +125˚C
−55˚C
or VIL(Min)
50Ω to −2.0V
0˚C to +125˚C
−55˚C
=
−1085
VIN VIH (Min)
Loading with
(Notes 3, 4,
5)
−1610
0˚C to +125˚C
−55˚C
or VIL (Max)
50Ω to −2.0V
−1555
−1165 −870
−55˚C to +125˚C
Guaranteed HIGH Signal
for All Inputs
(Notes 3, 4,
5, 6)
−1830 −1475
0.50
mV
µA
−55˚C to +125˚C
−55˚C to +125˚C
Guaranteed LOW Signal
for All Inputs
(Notes 3, 4,
5, 6)
=
VEE −4.2V
IIL
(Notes 3, 4,
5)
=
VIN VIL (Min)
IIH
Input HIGH Current
Data
350
240
500
340
µA
µA
0˚C to +125˚C
−55˚C
=
VEE −5.7V
Enable
(Notes 3, 4,
5)
=
Data
Enable
VIN VIH (Max)
IEE
Power Supply Current
−65
−20
mA
−55˚C to +125˚C
Inputs Open
(Notes 3, 4,
5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V /V
.
OH OL
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PrintDate=1998/08/31 PrintTime=07:05:03 45028 ds100297 Rev. No. 1 cmserv Proof
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ROCHESTER [ Rochester Electronics ]
