RT8008
Parameter
FB Input Current
Symbol
Test Conditions
Min
- 50
--
Typ
--
Max Units
50
--
nA
I
V
= V
FB
FB IN
0.3
0.4
0.25
0.35
--
V
V
V
V
= 3.6V
= 2.5V
= 3.6V
= 2.5V
IN
IN
IN
IN
W
PMOSFET R
P
I
= 200mA
= 200mA
ON
ON
RDS(ON) OUT
--
--
--
--
W
NMOSFET R
N
I
RDS(ON) OUT
--
--
P-Channel Current Limit
EN High-Level Input Voltage
EN Low-Level Input Voltage
Undervoltage Lock Out threshold
Hysteresis
1
1.8
--
A
V
I
V
V
V
= 2.5V to 5.5 V
= 2.5V to 5.5V
= 2.5V to 5.5V
P(LM)
IN
IN
IN
1.5
--
--
V
V
ENH
--
0.4
--
V
ENL
--
1.8
0.1
1.5
160
50
--
V
--
--
V
Oscillator Frequency
1.2
1.8
--
MHz
°C
ns
%
f
V
= 3.6V, I
= 100mA
OSC
IN
OUT
Thermal Shutdown Temperature
Min. On Time
--
--
T
SD
--
Max. Duty Cycle
100
- 1
--
LX Leakage Current
--
1
mA
V
= 3.6V, V = 0V or V = 3.6V
IN
LX
LX
Note 1. Stresses listed as the above “Absolute Maximum Ratings” may cause permanent damage to the device. These are for
stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended
periods may remain possibility to affect device reliability.
Note 2. Devices are ESD sensitive. Handling precaution recommended.
Note 3. The device is not guaranteed to function outside its operating conditions.
Note 4. qJA is measured in the natural convection at TA = 25°C on a low effective single layer thermal conductivity test board of
JEDEC 51-3 thermal measurement standard. Pin 2 of SOT-23-5/TSOT-23-5 packages is the case position for qJC
measurement.
DS8008-04 March 2007
www.richtek.com
5
RICHTEK [ RICHTEK TECHNOLOGY CORPORATION ]
