RT7273
Parameter
Symbol
Test Conditions
LIM1 = 37k
Min
2.4
Typ
3
Max
--
Unit
R
Current Limit CH 1
IOC_CH1
A
RLIM1 = 50k
3.4
4
--
RLIM1 = 63k
4.25
1.6
5
--
RLIM2, LIM3 = 44k
RLIM2, LIM3 = 69k
RLIM2, LIM3 = 94k
2
--
Current Limit CH 2, CH 3 IOC_CH2, CH3
2.55
3.4
3
--
A
4
--
Regulation
Line Regulation
VIN = 4.5V to 18V, IOUT = 1000mA
IOUT = 10% to 90%, IOUT_MAX
--
--
0.5
0.5
--
--
%VOUT
%VOUT
/A
Load Regulation
Error Amplifier
Error Amplifier
GEA
--
--
250
4
--
--
A/V
Transconductance
Comp to Current Sense
GCS
A/V
Transconductance
Power Good Reset Generator
Output Falling (device will be
--
--
85
90
--
--
disabled after tON_HICCUP
)
Under-Voltage Threshold VUV_CHx
%
Output Rising (PGOOD will be
asserted)
Under-Voltage Deglitch
tUV_DEGLITCH
Time
Each Channel Buck
--
--
10
10
--
--
ms
ms
Hiccup Mode On-Time
tON_HICCUP
VUV_CHx asserted
All Bucks disable during
tOFF_HICCUP before re-start is
attempted.
Hiccup Mode Off-Time
tOFF_HICCUP
--
--
15
--
--
ms
ms
Power good delay time after all
bucks power-up successfully
Power Good
tPGOOD
640
Thermal Shutdown
Thermal Shutdown
Threshold
TSD
--
--
150
20
--
--
°C
°C
Thermal Shutdown
Hysteresis
TSD
Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may
affect device reliability.
Note 2. θJA is measured at TA = 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. θJC is
measured at the exposed pad of the package.
Note 3. Devices are ESD sensitive. Handling precaution is recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
Copyright 2014 Richtek Technology Corporation. All rights reserved.
©
is a registered trademark of Richtek Technology Corporation.
www.richtek.com
8
DS7273-04 October 2014