RT6266
Parameter
Symbol
VIH
Test Conditions
Min
2.7
--
Typ
--
Max
--
Unit
Logic-High
Logic-Low
EN Input Threshold
Voltage
V
VIL
--
0.4
Input Under Voltage Lockout
Threshold
VUVLO
VIN Rising
6.3
--
6.7
0.5
7.2
1
V
V
Input Under Voltage Lockout
Hysteresis
VUVLO
Soft-Start Period
tSS
--
--
3.5
--
--
ms
C
Thermal Shutdown
TSD
150
Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect
device reliability.
Note 2. JA is measured at TA = 25C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. JC is
measured at the exposed pad of the package.
Note 3. Devices are ESD sensitive. Handling precaution recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
Typical Application Circuit
C
100n
BOOT
R
L1
39µH
SENSE
33m
V
OUT
5V/2.4A
D1
470µF
10µF
V
IN
1
2
8
VIN
SW
7.5V to 36V
RT6266
R1
180k
7,
0.1µF
20µF
BOOT
GND
9 (Exposed Pad)
R
EN
3
4
6
EN
FB
CSP
CSN
R2
34.3k
100k
5
Copyright © 2015 Richtek Technology Corporation. All rights reserved.
is a registered trademark of Richtek Technology Corporation.
www.richtek.com
6
DS6266-00 March 2015
RICHTEK [ RICHTEK TECHNOLOGY CORPORATION ]
