RT4801H
Parameter
Symbol
tHD,STA
Test Conditions
Min
0.6
0.6
1.3
0.6
100
0
Typ
--
Max
--
Unit
s
s
s
s
ns
Hold Time Start Condition
Setup Time for Start Condition tSU,STA
--
--
SCL Low Time
SCL High Time
Data Setup Time
Data Hold Time
tLOW
--
--
tHIGH
--
--
tSU,DAT
tHD,DAT
--
--
--
900
--
ns
Setup Time for Stop Condition tSU,STO
0.6
--
s
Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect
device reliability.
Note 2. JA is measured at TA = 25C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. JC is
measured at the exposed pad of the package.
Note 3. Devices are ESD sensitive. Handling precaution recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
Note 5. TOTP, TOTP_HYST are guaranteed by design.
Copyright © 2016 Richtek Technology Corporation. All rights reserved.
is a registered trademark of Richtek Technology Corporation.
www.richtek.com
6
DS4801H-00 May 2016
RICHTEK [ RICHTEK TECHNOLOGY CORPORATION ]
