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JAN2N2920L 参数 Datasheet PDF下载

JAN2N2920L图片预览
型号: JAN2N2920L
PDF下载: 下载PDF文件 查看货源
内容描述: [Small Signal Bipolar Transistor, 0.03A I(C), 60V V(BR)CEO, 2-Element, NPN, Silicon, SIMILAR TO TO-78, 6 PIN]
分类和应用: 晶体管
文件页数/大小: 20 页 / 229 K
品牌: RAYTHEON [ RAYTHEON COMPANY ]
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MIL-PRF-19500/355M  
1.4 Primary electrical characteristics of each individual section. Unless otherwise specified, TC =+25°C.  
hFE1  
|hfe|  
VCE(SAT)  
VCE = 5 V dc  
IC = 10 µA dc  
VCE = 5 V dc  
IC = 0.5 mA dc  
f = 20 MHz  
IC = 1 mA dc  
IB = 100 µA dc  
2N2919 2N2919L  
2N2920 2N2920L  
2N2920U  
2N2919U  
V dc  
0.3  
Min  
Max  
60  
240  
175  
600  
3.0  
20  
1.5 Primary electrical matching characteristics of each individual section. Unless otherwise specified, TC =+25°C.  
|VBE1 - VBE2  
|
1
|(VBE1 - VBE2 TA  
)
|
|(VBE1 - VBE2)TA |  
2
hFE 21  
hFE22  
1
VCE = 5 V dc  
VCE = 5 V dc  
VCE = 5 V dc  
VCE = 5 V dc  
IC = 10 µA dc  
IC = 100 µA dc  
IC = 100 µA dc  
TA = +25°C and -55°C  
IC = 100 µA dc  
TA = +125°C and +25°C  
(1)  
mV dc  
5
mV dc  
0.8  
mV dc  
1.0  
Min  
Max  
0.9  
1.0  
(1) The larger number will be placed in the denominator.  
2. APPLICABLE DOCUMENTS  
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This  
section does not include documents cited in other sections of this specification or recommended for additional  
information or as examples. While every effort has been made to ensure the completeness of this list, document  
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this  
specification, whether or not they are listed.  
2.2 Government documents.  
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a  
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are  
those cited in the solicitation or contract.  
DEPARTMENT OF DEFENSE SPECIFICATIONS  
MIL-PRF-19500  
DEPARTMENT OF DEFENSE STANDARDS  
MIL-STD-750 Test Methods for Semiconductor Devices.  
-
Semiconductor Devices, General Specification for.  
-
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch or  
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,  
Philadelphia, PA 19111-5094.)  
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited  
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws  
and regulations unless a specific exemption has been obtained.  
2