P3C1041
TIMING WAVEFORM OF READ CYCLE NO. 1
TIMING WAVEFORM OF READ CYCLE NO. 2 (OE CONTROLLED)(5,6)
Notes:
1. Stresses greater than those listed under MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification
is not implied. Exposure to MAXIMUM rating conditions for extended
periods may affect reliability.
4. This parameter is sampled and not 100% tested.
5. WE is HIGH for READ cycle.
6. CE is LOW and OE is LOW for READ cycle.
7. ADDRESSmustbevalidpriorto,orcoincidentwithCE transitionLOW.
8. Transition is measured ± 200 mV from steady state voltage prior to
change, with loading as specified in Figure 1. This parameter is
sampled and not 100% tested.
2. Extended temperature operation guaranteed with 400 linear feet per
minute of air flow.
3. Transient inputs with VIL not more negative than –2.0V and
9. Read Cycle Time is measured from the last valid address to the first
transitioning address.
VIH ≤ VCC + 0.5V, are permissible for pulse widths up to 20ns.
Document # SRAM130 REV OR
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PYRAMID [ PYRAMID SEMICONDUCTOR CORPORATION ]
