PACE1753/SOS
DC ELECTRICAL SPECIFICATIONS (Over recommended operating conditions)
1
Symbol
Parameter
Min
2.0
Max
V + 0.5
CC
Unit
V
Conditions
V
V
V
Input HIGH Voltage
IH
IL
2
Input LOW Voltage
–0.5
0.8
V
Input Clamp Diode Voltage
Output HIGH Voltage
–1.2
V
V
V
V
V
V
V
V
= 4.5V, I = –18mA
IN
CD
CC
2.4
V
= 4.5V,
= 0.8V, 2.0V
I
I
I
I
I
I
= –8.0mA
= –300µA
= 8.0mA
= 300µA
= 20.0mA
= 300µA
CC
OH
OH
OL
OL
OL
OL
V
OH
V
OL
V
OL
V
– 0.2
V
CC
IN
4
Output LOW Voltage,
0.65
0.2
V
= 4.5V,
CC
except EXT ADR – EXT ADR
V
= 0.8V, 2.0V
0
7
IN
4
Output LOW Voltage,
0.65
0.2
V
= 4.5V,
CC
EXT ADR – EXT ADR
V
= 0.8V, 2.0V
0
7
IN
Input HIGH Current,
I
IH
except IB – IB ,
300
µA
V
V
= V
,
CC
0
15
IN
EDC – EDC ,
= 5.5V
0
5
CC
EXT ADR – EXT ADR
0
7
Input HIGH Current,
V
V
= V
,
CC
IN
I
I
IB – IB , EDC – EDC ,
100
–50
µA
µA
= 5.5V
IH
0
15
0
5
CC
EXT ADR – EXT ADR
0
7
Input LOW Current,
except IB – IB ,
V
V
= GND,
= 5.5V
IL
0
15
IN
EDC – EDC ,
0
5
CC
EXT ADR – EXT ADR
0
7
Input LOW Current,
V
V
= GND,
IN
I
IL
IB – IB , EDC – EDC ,
–50
µA
= 5.5V
0
15
0
5
CC
EXT ADR – EXT ADR
0
7
I
I
Output Three-State Current
Output Three-State Current
50
µA
µA
V
V
V
= 2.4V, V = 5.5V
CC
OZH
OUT
–50
= 0.5V, V = 5.5V
CC
OZL
OUT
Quiescent Power Supply
Current (CMOS Input
Levels, Active)
< 0.2V or < V – 0.2V
CC
IN
I
60
mA
mA
f = 0MHz, Outputs Open,
CCQC
CCQT
V
CC
= 5.5V
Quiescent Power Supply
Current (TTL Input
Levels, Active)
V
IN
= 3.4V, f = 0MHz,
I
110
All Inputs, Outputs Open,
= 5.5V
V
CC
VCC = 0V to VCC
tr = tf = 2.5 ns,
Outputs Open,
VCC = 5.5V
,
Dynamic Power Supply
Current
90
mA
mA
mA
mA
pF
F = 20MHz
F = 30MHz
F = 40MHz
I
I
100
125
CCD
3
Output Short Circuit Current
Input Capacitance
–25
V = GND, V = 5.5V
OUT CC
OS
C
10
15
Inputs Only
IN
C
Output/Bi-directional
Capacitance
pF
Outputs Only
(Including I/O Buffers)
OUT
Notes
1. 4.5V ≤ V ≤ 5.5V, –55°C ≤ T ≤ +125°C. Unless otherwise specified, testing shall be conducted at worst-case conditions.
CC
C
2. V = –3.0V for pulse widths less than or equal to 20ns.
IL
3. Duration of the short should not exceed one second; only one output may be shorted at a time.
4. Testmaybeperformedbysetting/forcingtheparameterlimit(voltage)andmeasuringtheappropriatecurrentparameter.
Do c um e nt # MICRO-8 REV B
Pa g e 3 o f 17
PYRAMID [ PYRAMID SEMICONDUCTOR CORPORATION ]
