AS80SSTVF16859
&
Parameter Measurement Information (V = 2.5 V ± 0.2 V)
DD
V
TT
R = 50 Ω
L
From output under test
Test point
1
C = 30 pF
L
Load circuit
1
C includes probe and jig capacitance.
L
Voltage and Current Waveforms
In the following waveforms, note that all input pulses are supplied by generators having the following
characteristics: PRR ≤ 10 MHz, Z = 50 Ω, input slew rate = 1 V/ns ± 20% (unless otherwise specified).
o
The outputs are measured one at a time with one transition per measurement.
V
V
= V
= V
/2.
TT
IH
REF
REF
REF
DDQ
= V
+ 310 mV (AC voltage levels) for differential inputs. V = V for LVCMOS input.
IH DD
V = V
- 310 mV (AC voltage levels) for differential inputs. V = GND for LVCMOS input.
IL
IL
t
and t
are the same as t .
PLH
PHL pd
Input active and inactive times
VDD
LVCMOS RESETB
Input
VDD/2
tinact
VDD/2
tact
0 V
1
IDD
IDDH
90%
10%
IDDL
1 IDD tested with clock and data inputs held at VDD or GND, and IO = 0 mA.
Pulse duration
t
w
V
V
IH
IL
V
V
REF
Input
REF
Setup and hold times
V
I(pp)
V
Timing input
Input
ICR
t
t
h
s
V
V
IH
IL
V
V
REF
REF
8/6/03, v.0.10
Alliance Semiconductor
P. 9 of 13
PULSECORE [ PulseCore Semiconductor ]
