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1N4755ARL2 参数 Datasheet PDF下载

1N4755ARL2图片预览
型号: 1N4755ARL2
PDF下载: 下载PDF文件 查看货源
内容描述: [43V, 1W, SILICON, UNIDIRECTIONAL VOLTAGE REGULATOR DIODE, DO-41, HERMETIC SEALED, GLASS, CASE 59-10, 2 PIN]
分类和应用: 测试二极管
文件页数/大小: 8 页 / 65 K
品牌: ONSEMI [ ONSEMI ]
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1N4728A Series  
APPLICATION NOTE  
Since the actual voltage available from a given zener  
T is the increase in junction temperature above the lead  
JL  
diode is temperature dependent, it is necessary to determine  
junction temperature under any set of operating conditions  
in order to calculate its value. The following procedure is  
recommended:  
temperature and may be found as follows:  
TJL = θJLPD.  
θ
may be determined from Figure 3 for dc power  
JL  
Lead Temperature, T , should be determined from:  
L
conditions. For worst-case design, using expected limits of  
I , limits of P and the extremes of T (T ) may be  
Z
D
J
J
TL = θLAPD + TA.  
estimated. Changes in voltage, V , can then be found  
Z
from:  
θ
is the lead-to-ambient thermal resistance (°C/W) and P  
D
LA  
is the power dissipation. The value for θ will vary and  
LA  
V = θVZ TJ.  
depends on the device mounting method. θ is generally 30  
LA  
to 40°C/W for the various clips and tie points in common use  
and for printed circuit board wiring.  
θ
, the zener voltage temperature coefficient, is found  
VZ  
from Figure 2.  
The temperature of the lead can also be measured using a  
thermocouple placed on the lead as close as possible to the  
tie point. The thermal mass connected to the tie point is  
normally large enough so that it will not significantly  
respond to heat surges generated in the diode as a result of  
pulsed operation once steady-state conditions are achieved.  
Under high power-pulse operation, the zener voltage will  
vary with time and may also be affected significantly by the  
zener resistance. For best regulation, keep current  
excursions as low as possible.  
Surge limitations are given in Figure 5. They are lower  
than would be expected by considering only junction  
temperature, as current crowding effects cause temperatures  
to be extremely high in small spots, resulting in device  
degradation should the limits of Figure 5 be exceeded.  
Using the measured value of T , the junction temperature  
L
may be determined by:  
TJ = TL + TJL.  
http://onsemi.com  
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