FEDL2201-01
Semiconductor
1
ML2201–XXX
FUNCTIONAL DESCRIPTION
Sampling Frequency
You can select a sampling frequency for each phrase address from the following list while you are working on
sound data. Select a sampling frequency that satisfies f
SAM
= 3.9 to 28.0 kHz from the values obtained with the
dividing factors as shown in the Table 1 below.
Table 1 Sampling Frequency
Sampling Frequency
At f
EXTCLK
= 4.096 MHz
4.0 kHz
5.3 kHz
6.4 kHz
8.0 kHz
10.6 kHz
12.8 kHz
16.0 kHz
Dividing Factor
f
EXTCLK
/1024
f
EXTCLK
/768
f
EXTCLK
/640
f
EXTCLK
/512
f
EXTCLK
/384
f
EXTCLK
/320
f
EXTCLK
/256
Memory Allocation and Playback Time Length
As shown in the Figure 1, the on-chip Mask ROM of ML2201 is partitioned into four areas, Phrase Control Table,
Address Control Table, Test Data area and User’s Data area. The actual data area where user’s sound data can be
stored is 378 Kbit, that is the total on-chip Mask ROM capacity minus 6 Kbit.
Phrase Control Table Area
Address Control Table Area
Test Data Area
2 Kbit
2 Kbit
2 Kbit
User’s Sound Data Area
378 Kbit
Figure 1 On-chip Mask ROM (384 Kbit) Memory Allocation
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