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Email: info@kingtronics.com Tel: (852) 8106 7033 Fax: (852) 8106 7099
LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
14. Moisture Resistance ,steady state
Dielectrics
Specification
Testing Condition
No remarkable visual damage
Cp change within ±5% or ±0.5pF,
whichever is larger.
Cp<10pF, Q≥200+10Cp;
IO≤Cp<30pF, Q≥275+2.5Cp
Cp≥30pF, Q≥350
R*C≥1000MΩ or 50Ω·F, whichever is
smaller
Cp change within ±12.5%
DF: Not more than 2 times of initial value
R*C≥1000MΩ or 50Ω·F, whichever is
smaller
No remarkable visual damage
Cp change within ±30%
DF: Not more than 1.5 times of
initial value
R*C≥1000MΩ or 50Ω·F, whichever is
smaller
Test temperature: 40±2℃
Humidity: 90~95% RH
Testing time: 500 ±12hrs
NPO
Measurement to be made after being kept at room
temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,
Y5V)
X7R/X5R
Y5V
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150℃ for 1hr and let sit
for 48±4hrs at room temperature.
Perform the initial measurement.
15. Damp heat with load
Dielectrics
Specification
Testing Condition
No remarkable visual damage
Cp change≤±7.5% or ±0.75pF, whichever
is larger.
NPO
Cp<30pF, Q≥100+10/3*Cp
Cp≥30pF, Q≥200
Test temperature: 40±2℃
Humidity: 90~95% RH
Voltage: 100% of the rated voltage
Testing time: 500 ±12hrs
R*C≥500MΩ or 25Ω·F, whichever is
smaller
No remarkable visual damage
Cp change≤±12.5%
DF: Not more than 2 times of initial value
R*C≥500MΩ or 25Ω·F, whichever is
smaller
No remarkable visual damage
Cp change≤±30%
DF: Not more than 1.5 times of
initial value
R*C≥500MΩ or 25Ω·F , whichever is
smaller
Measurement to be made after being kept at room
temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,
Y5V)
X7R/X5R
Y5V
*Apply the rated DC voltage for 1 hour at 40±2℃.
Remove and let sit for 48±4hrs at room temperature.
Perform the initial measurement.
16. Life Test
Dielectrics
Specification
Testing Condition
No remarkable visual damage
Cp change≤±3% or ±0.3pF, whichever is
larger.
Q≥350 (Cp≥30 PF)
Q≥275+(2.5* Cp) (10 pF≤Cp<30 PF)
Q≥200+10*Cp (Cp<10 PF)
R*C≥1000MΩ or 50Ω·F, whichever is smaller
No remarkable visual damage
Cp change≤±12.5%
DF:Not more than 2 times of initial value
R*C≥1000MΩ or 50Ω·F, whichever is smaller
Test temperature:
Max. Operating Temp. ±3℃
Voltage:
200% of the rated voltage
Testing time: 1000 hrs
NPO
Measurement to be made after being kept at room temperature
for 24±2hrs (COG) or 48±4hrs (X7R, X5R,Y5V)
X7R/X5R
Y5V
*Initial measurement for high dielectric constant type
Apply 200% of the rated DC voltage for one hour at the
maximum operating temperature ±3℃.
Remove and let sit for 48±4hrs at room temperature.
Perform the initial measurement
No remarkable visual damage
Cp change≤±30%
DF:Not more than 1.5 times of
initial value
R*C≥1000MΩ or 50Ω·F, whichever is smaller
6
KINGTRONICS [ Kingtronics International Company ]
