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LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
11. Bending
Dielectrics
Specification
Testing Condition
Solder the capacitor on testing substrate and put it on
testing stand. The middle part of substrate shall
successively be pressurized by pressuring rod at a rated of
about 1.0mm/sec. Until the deflection become means of the
1.0mm.
No remarkable visual damage
Cp change ≤ ±5% or ≤ 0.5 pF
NPO
No remarkable visual damage
Cp change ≤ ±12.5%
X7R/X5R
No remarkable visual damage
Cp change ≤ ±30%
Y5V
12. Resistance to Soldering Heat
Dielectrics
Specification
Testing Condition
No remarkable visual damage
Cp change within ±2.5% or ±0.25pF,
whichever is larger.
DF meets initial standard value.
IR meets initial standard value.
No remarkable visual damage
Soldering temperature: 270±5℃
Preheating: 120~150℃ 60sec.
Dipping time: 10±1 seconds.
NPO
Measurement to be made after being kept at room
temperature for 24±2 (COG) or 48±4(X7R ,X5R, Y5V)
hours.
Recovery for the following period under the standard
condition after test.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150℃ for 1hr and let sit
for 48±4hrs at room temperature. Perform the initial
measurement.
Cp change within ±5%
X7R/X5R
Y5V
DF meets initial standard value.
IR meets initial standard value.
No remarkable visual damage
Cp change within ±20%
DF meets initial standard value.
IR meets initial standard value.
13. Temperature Cycle
Dielectrics
Specification
Testing Condition
To perform 5 cycles of the stated environment:
Step
Temperature
Min. operating Temp.+0/-3℃
25℃
Max. operating Temp.+0/-3℃
25℃
Time
30min
2~3 min
30 min
2~3 min
No remarkable visual damage
Cp change within ±2.5% or ±0.25pF,
whichever is larger.
NPO
1
2
3
4
Measurement to be made after being kept at room
temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,
Y5V) at room temperature, then measure.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150℃ for 1hr and let sit
for 48±4hrs at room temperature.
No remarkable visual damage
Cp change within ±7.5%
X7R/X5R
Perform the initial measurement.
5
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