CY7C372i
Output Current into Outputs ........................................ 16 mA
Maximum Ratings
Static Discharge Voltage...........................................> 2001V
(per MIL–STD–883, Method 3015)
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Latch-up Current.....................................................> 200 mA
Storage Temperature .................................–65°C to +150°C
Operating Range
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Ambient
VCC
VCCINT
Supply Voltage to Ground Potential............... –0.5V to +7.0V
Range
Temperature
VCCIO
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
Commercial
0°C to +70°C
5V ± 0.25V 5V± 0.25Vor
3.3V ± 0.3V
DC Input Voltage............................................ –0.5V to +7.0V
DC Program Voltage.....................................................12.5V
Industrial
Military[2]
−40°C to +85°C
5V ± 0.5V
5V ± 0.5V
3.3V ± 0.3V
–55°C to +125°C 5V ± 0.5V
Electrical Characteristics Over the Operating Range[3, 4]
Parameter
Description
Test Conditions
VCC = Min. IOH = –3.2 mA (Com’l/Ind)[5]
OH = –2.0 mA (Mil)
Min.
2.4
Typ.
Max.
Unit
V
VOH
Output HIGH Voltage
I
2.4
V
VOHZ
VOL
Output HIGH Voltage with VCC = Max. IOH = 0 µA (Com’l/Ind)[5, 6]
4.0
3.6
0.5
0.5
7.0
V
Output Disabled[8]
I
OH = –50 µA (Com’l/Ind)[5, 6]
V
Output LOW Voltage
VCC = Min. IOL = 16 mA (Com’l/Ind)[5]
V
IOL = 12 mA (Mil)
V
VIH
VIL
Input HIGH Voltage
Input LOW Voltage
Guaranteed Input Logical HIGH Voltage for all
Inputs[7]
2.0
V
Guaranteed Input Logical LOW Voltage for all
Inputs[7]
–0.5
0.8
V
IIX
Input Load Current
VI = Internal GND, VI = VCC
–10
–50
+10
+50
µA
µA
IOZ
Output Leakage Current
VCC = Max., VO = GND or VO = VCC, Output
Disabled
VCC = Max., VO = 3.3V, Output Disabled[6]
0
–70
–125
–160
µA
IOS
ICC
Output Short
VCC = Max., VOUT = 0.5V
–30
mA
Circuit Current[8, 9]
Power Supply Current [10] VCC = Max., IOUT = 0 mA,
f = 1 MHz, VIN = GND, VCC
Com’l/Ind.
Com’l “L” –66
Military
75
45
75
125
75
mA
mA
mA
µA
200
IBHL
Input Bus Hold LOW
Sustaining Current
VCC = Min., VIL = 0.8V
VCC = Min., VIH = 2.0V
VCC = Max.
+75
–75
IBHH
IBHLO
Input Bus Hold HIGH
Sustaining Current
µA
µA
µA
Input Bus Hold LOW
Overdrive Current
+500
IBHHO
Input Bus Hold HIGH
Overdrive Current
VCC = Max.
−500
Notes:
2. T is the “instant on” case temperature.
A
3. See the last page of this specification for Group A subgroup testing information.
4. If V is not specified, the device can be operating in either 3.3V or 5V I/O mode; V = V .
CCINT
CCIO
CC
5. For SDO: I =–2 mA, I = 2 mA.
OH
OL
6. When the I/O is three-stated, the bus-hold circuit can weakly pull the I/O to a maximum of 4.0V if no leakage current is allowed. This voltage is lowered significantly
by a small leakage current. Note that all I/Os are three-stated during ISR programming. Refer to the application note “Understanding Bus Hold” for additional
information.
7. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
8. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. V
problems caused by tester ground degradation.
= 0.5V has been chosen to avoid test
OUT
9. Tested initially and after any design or process changes that may affect these parameters.
10. Measured with 16-bit counter programmed into each logic block.
Document #: 38-03033 Rev. *A
Page 4 of 13
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