STK12C68-5 (SMD5962-94599)
Data Retention and Endurance
Parameter
DATAR
NVC
Description
Data retention
Nonvolatile STORE operations
Min
100
Unit
Years
K
1,000
Capacitance
In the following table, the capacitance parameters are listed.[6]
Parameter
CIN
COUT
Description
Input capacitance
Output capacitance
Test Conditions
Max
8
Unit
pF
TA = 25 C, f = 1 MHz,
VCC = 0 to 3.0 V
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[6]
Parameter
Description
Test Conditions
28-CDIP 28-LCC
Unit
JA
Thermal resistance
(junction to ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
TBD
TBD
C/W
JC
Thermal resistance
(junction to case)
TBD
TBD
C/W
Figure 7. AC Test Loads
R1 963
R1 963
For Tristate Specs
5.0 V
5.0 V
Output
Output
R2
R2
512
30 pF
5 pF
512
AC Test Conditions
Input Pulse Levels..................................................0 V to 3 V
Input Rise and Fall Times (10% to 90%)...................... <5 ns
Input and Output Timing Reference Levels.......................1.5
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: 001-51026 Rev. *C
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