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5962-8984105KX 参数 Datasheet PDF下载

5962-8984105KX图片预览
型号: 5962-8984105KX
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存擦除可再编程的CMOS PAL器件 [Flash-erasable Reprogrammable CMOS PAL Device]
分类和应用: 闪存
文件页数/大小: 13 页 / 350 K
品牌: CYPRESS [ CYPRESS ]
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USE ULTRA37000TM FOR  
ALL NEW DESIGNS  
PALCE22V10  
AC Test Loads and Waveforms  
R1238Ω  
(319MIL)  
R1238Ω  
(319MIL)  
5V  
5V  
OUTPUT  
OUTPUT  
OUTPUT  
750Ω  
R2170Ω  
(236MIL)  
R2170Ω  
(236MIL)  
(1.2KΩ  
C
L
5pF  
C
L
MIL)  
INCLUDING  
JIG AND  
SCOPE  
INCLUDING  
JIG AND  
SCOPE  
(a)  
(b)  
(c)  
ALL INPUT PULSES  
90%  
3.0V  
90%  
10%  
10%  
GND  
< 2ns  
< 2ns  
(d)  
Equivalent to:THÉVENIN Equivalent (Commercial)  
Equivalent to: THÉVENIN Equivalent (Military)  
99Ω  
136Ω  
OUTPUT  
2.08V = VTHC  
OUTPUT  
2.13V = VTHM  
Load Speed  
CL  
Package  
5, 7.5, 10, 15, 25 ns  
50 pF  
PDIP, CDIP,  
PLCC, LCC  
Parameter VX  
Output Waveform Measurement Level  
tER (- )  
tER (+)  
tEA (+)  
tEA (- )  
1.5V  
2.6V  
0V  
VOH  
VX  
VX  
0.5V  
0.5V  
VOL  
1.5V  
VOH  
VX  
VX  
Vthc  
VOL  
0.5V  
(e) Test Waveforms  
[2, 7]  
Commercial Switching Characteristics PALCE22V10  
22V10-5  
22V10-7  
22V10-10  
22V10-15  
22V10-25  
Parameter  
Description  
Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit  
tPD  
Input to Output  
3
5
3
7.5  
3
10  
3
15  
3
25  
ns  
Propagation Delay[8]  
tEA  
tER  
Input to Output Enable Delay[9]  
Input to Output Disable Delay[10]  
Clock to Output Delay[8]  
6
6
4
8
8
5
10  
10  
7
15  
15  
8
25  
25  
15  
ns  
ns  
ns  
tCO  
2
2
2
2
2
Notes:  
7. Part (a) of AC Test Loads and Waveforms is used for all parameters except t and t  
. Part (b) of AC Test Loads and Waveforms is used for t . Part (c) of AC Test  
ER  
ER  
EA(+)  
Loads and Waveforms is used for t  
.
EA(+)  
8. Min. times are tested initially and after any design or process changes that may affect these parameters.  
9. The test load of (a) of AC Test Loads and Waveforms is used for measuring t . The test load of (c) of AC Test Loads and Waveforms is used for measuring t  
only.  
EA(+)  
EA(-)  
Please see (e) of AC Test Loads and Waveforms for enable and disable test waveforms and measurement reference levels.  
10. This parameter is measured as the time after output disable input that the previous output data state remains stable on the output. This delay is measured to  
the point at which a previous HIGH level has fallen to 0.5V below V min. or a previous LOW level has risen to 0.5V above V max. Please see (e) of AC Test Loads  
OH  
OL  
and Waveforms for enable and disable test waveforms and measurement reference levels.  
Document #: 38-03027 Rev. *B  
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