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5962-8984102LX 参数 Datasheet PDF下载

5962-8984102LX图片预览
型号: 5962-8984102LX
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存擦除可再编程的CMOS PAL器件 [Flash-erasable Reprogrammable CMOS PAL Device]
分类和应用: 闪存可编程逻辑输入元件时钟
文件页数/大小: 13 页 / 350 K
品牌: CYPRESS [ CYPRESS ]
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USE ULTRA37000TM FOR  
ALL NEW DESIGNS  
PALCE22V10  
Output Current into Outputs (LOW)............................. 16 mA  
DC Programming Voltage............................................. 12.5V  
Latch-up Current.....................................................> 200 mA  
Maximum Ratings  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Static Discharge Voltage  
(per MIL-STD-883, Method 3015) ............................>2001V  
Operating Range  
Storage Temperature .................................–65°C to +150°C  
Ambient Temperature with  
Power Applied.............................................–55°C to +125°C  
Ambient  
Supply Voltage to Ground Potential  
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V  
Range  
Commercial  
Industrial  
Temperature  
VCC  
0°C to +75°C  
–40°C to +85°C  
–55°C to +125°C  
5V ±5%  
5V ±10%  
5V ±10%  
DC Voltage Applied to Outputs  
in High-Z State ............................................... –0.5V to +7.0V  
Military[1]  
DC Input Voltage............................................ –0.5V to +7.0V  
Electrical Characteristics Over the Operating Range[2]  
Parameter  
Description  
Test Conditions  
Min. Max. Unit  
VOH  
Output HIGH Voltage  
VCC = Min.,  
IN = VIH or VIL  
IOH = –3.2 mA  
Com’l  
Mil/Ind  
Com’l  
Mil/Ind  
2.4  
V
V
I
OH = –2 mA  
VOL  
VIH  
Output LOW Voltage  
VCC = Min.,  
VIN = VIH or VIL  
IOL = 16 mA  
0.5  
V
I
OL = 12 mA  
Input HIGH Level  
Guaranteed Input Logical HIGH Voltage for All Inputs[3]  
Guaranteed Input Logical LOW Voltage for All Inputs[3]  
VSS < VIN < VCC, VCC = Max.  
2.0  
–0.5  
–10  
–40  
V
V
[4]  
VIL  
Input LOW Level  
0.8  
10  
40  
IIX  
Input Leakage Current  
µA  
µA  
IOZ  
ISC  
ICC1  
Output Leakage Current  
Output Short Circuit Current VCC = Max., VOUT = 0.5V[5,6]  
VCC = Max., VSS < VOUT < VCC  
–30 –130 mA  
90 mA  
Standby Power Supply  
Current  
VCC = Max.,  
IN = GND,  
10, 15, 25 ns  
5, 7.5 ns  
15, 25 ns  
10 ns  
Com’l  
V
130 mA  
120 mA  
120 mA  
110 mA  
140 mA  
130 mA  
130 mA  
Outputs Open in Unprogrammed  
Device  
Mil/Ind  
[6]  
ICC2  
Operating Power Supply  
Current  
VCC = Max., VIL = 0V, VIH = 3V,  
Output Open, Device Programmed  
as a 10-bit Counter,  
10, 15, 25 ns  
5, 7.5 ns  
15, 25 ns  
10 ns  
Com’l  
Com’l  
Mil/Ind  
Mil/Ind  
f = 25 MHz  
Capacitance[6]  
Parameter  
CIN  
Description  
Input Capacitance  
Output Capacitance  
Test Conditions  
Min.  
Max.  
Unit  
pF  
VIN = 2.0V @ f = 1 MHz  
VOUT = 2.0V @ f = 1 MHz  
10  
10  
COUT  
pF  
Endurance Characteristics[6]  
Parameter  
Description  
Minimum Reprogramming Cycles  
Test Conditions  
Normal Programming Conditions  
Min.  
Max.  
Unit  
N
100  
Cycles  
Notes:  
1. T is the “instant on” case temperature.  
A
2. See the last page of this specification for Group A subgroup testing information.  
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.  
4. V (Min.) is equal to –3.0V for pulse durations less than 20 ns.  
IL  
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V  
caused by tester ground degradation.  
= 0.5V has been chosen to avoid test problems  
OUT  
6. Tested initially and after any design or process changes that may affect these parameters.  
Document #: 38-03027 Rev. *B  
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